pith:DPECJPFF
Thicker amorphous grain boundary complexions reduce plastic strain localization in nanocrystalline Cu-Zr
Thicker amorphous grain boundary complexions reduce plastic strain localization in nanocrystalline Cu-Zr alloys.
arxiv:2601.18059 v3 · 2026-01-26 · cond-mat.mtrl-sci
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Claims
The sample with thicker complexions displayed more homogeneous plasticity and higher damage tolerance; thicker amorphous complexions suppress localization by absorbing defects. This work demonstrates that increasing complexion thickness can be beneficial for stable plastic flow in nanocrystalline alloys, by improving resistance to strain localization and premature failure.
The two model materials differ only in their complexion thickness, with one having a thicker complexion population than the other, and that all observed differences in deformation behavior are caused solely by this thickness variation rather than other uncontrolled microstructural factors.
Thicker amorphous grain boundary complexions in nanocrystalline Cu-Zr reduce strain localization and promote homogeneous plasticity by absorbing defects during compression.
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| First computed | 2026-06-01T01:02:30.237664Z |
|---|---|
| Builder | pith-number-builder-2026-05-17-v1 |
| Signature | Pith Ed25519
(pith-v1-2026-05) · public key |
| Schema | pith-number/v1.0 |
Canonical hash
1bc824bca5bf34af05d8c15b1158c5e94c97ebc939d6a43f50aea7ba27b6cfd0
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curl -sH 'Accept: application/ld+json' https://pith.science/pith/DPECJPFFX42K6BOYYFNRCWGF5F \
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Canonical record JSON
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