{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2026:EATJ2LDM2H5BA5IGMFPSI4RWTY","short_pith_number":"pith:EATJ2LDM","schema_version":"1.0","canonical_sha256":"20269d2c6cd1fa107506615f2472369e36abd5bfa7aa1afed76d1fb7a2e6d7d2","source":{"kind":"arxiv","id":"2605.06312","version":2},"attestation_state":"computed","paper":{"title":"Ablation Removal of Transport-Blocking Defects in Surface-Electrode Ion Traps","license":"http://creativecommons.org/licenses/by/4.0/","headline":"A 532 nm pulsed laser removes transport-blocking defects from surface-electrode ion traps without breaking vacuum.","cross_cats":[],"primary_cat":"quant-ph","authors_text":"Matthew Aylett, Parsa Rahimi, Rares Barcan, Sebastian Weidt, Toby Maddock, Winfried Karl Hensinger","submitted_at":"2026-05-07T14:13:26Z","abstract_excerpt":"We demonstrate in situ removal of a transport-blocking defect on a surface-electrode ion trap device using a Q-switched Nd:YAG 532 nm pulsed ablation laser. This approach eliminates the need to vent and rebake the vacuum system, providing a low-overhead defect-remediation technique well suited for ion-shuttling architectures where system modifications typically incur substantial downtime - particularly in shuttling focussed experiments operating at temperatures that necessitate bakes. Additionally, the hardware used is readily available in many ion trap laboratories, making this solution attra"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"2605.06312","kind":"arxiv","version":2},"metadata":{"license":"http://creativecommons.org/licenses/by/4.0/","primary_cat":"quant-ph","submitted_at":"2026-05-07T14:13:26Z","cross_cats_sorted":[],"title_canon_sha256":"e77e48427e1d6fbd464e5f8adccd27494771b0a982fa9719c712ac917037ec40","abstract_canon_sha256":"5c71c0a86d9b83cbda086d89fe119fc9985b417bde10ef8c97f20dd16a866a0f"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-22T01:04:05.180527Z","signature_b64":"yJmzQyfBMDkF3TVHdDmh2pEMRkU9k8dVnKJe4BEAjIcWWFZV8eO++wx5TD5t+tGvZ8K+RSVC3sgAh2/JKudECw==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"20269d2c6cd1fa107506615f2472369e36abd5bfa7aa1afed76d1fb7a2e6d7d2","last_reissued_at":"2026-05-22T01:04:05.179827Z","signature_status":"signed_v1","first_computed_at":"2026-05-22T01:04:05.179827Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Ablation Removal of Transport-Blocking Defects in Surface-Electrode Ion Traps","license":"http://creativecommons.org/licenses/by/4.0/","headline":"A 532 nm pulsed laser removes transport-blocking defects from surface-electrode ion traps without breaking vacuum.","cross_cats":[],"primary_cat":"quant-ph","authors_text":"Matthew Aylett, Parsa Rahimi, Rares Barcan, Sebastian Weidt, Toby Maddock, Winfried Karl Hensinger","submitted_at":"2026-05-07T14:13:26Z","abstract_excerpt":"We demonstrate in situ removal of a transport-blocking defect on a surface-electrode ion trap device using a Q-switched Nd:YAG 532 nm pulsed ablation laser. This approach eliminates the need to vent and rebake the vacuum system, providing a low-overhead defect-remediation technique well suited for ion-shuttling architectures where system modifications typically incur substantial downtime - particularly in shuttling focussed experiments operating at temperatures that necessitate bakes. Additionally, the hardware used is readily available in many ion trap laboratories, making this solution attra"},"claims":{"count":4,"items":[{"kind":"strongest_claim","text":"We demonstrate in situ removal of a transport-blocking defect on a surface-electrode ion trap device using a Q-switched Nd:YAG 532 nm pulsed ablation laser. Following ablation, we observe near-unit shuttling success rates across the previously obstructed region and measure micromotion levels that remain within acceptable limits.","source":"verdict.strongest_claim","status":"machine_extracted","claim_id":"C1","attestation":"unclaimed"},{"kind":"weakest_assumption","text":"The ablation removes the defect without creating new surface contaminants, charging, or structural damage that would degrade ion lifetime, coherence, or future shuttling performance over extended operation.","source":"verdict.weakest_assumption","status":"machine_extracted","claim_id":"C2","attestation":"unclaimed"},{"kind":"one_line_summary","text":"A Q-switched Nd:YAG 532 nm pulsed laser ablates transport-blocking defects in surface-electrode ion traps in situ, restoring near-unit shuttling success rates without interrupting vacuum operation.","source":"verdict.one_line_summary","status":"machine_extracted","claim_id":"C3","attestation":"unclaimed"},{"kind":"headline","text":"A 532 nm pulsed laser removes transport-blocking defects from surface-electrode ion traps without breaking vacuum.","source":"verdict.pith_extraction.headline","status":"machine_extracted","claim_id":"C4","attestation":"unclaimed"}],"snapshot_sha256":"172815f3ce5273d09703df3f3d565f1afcd2741606f3fd6debf7bde5e356b2d9"},"source":{"id":"2605.06312","kind":"arxiv","version":2},"verdict":{"id":"1094b090-e1b1-4322-9c29-cd073733e77c","model_set":{"reader":"grok-4.3"},"created_at":"2026-05-08T11:11:07.741492Z","strongest_claim":"We demonstrate in situ removal of a transport-blocking defect on a surface-electrode ion trap device using a Q-switched Nd:YAG 532 nm pulsed ablation laser. Following ablation, we observe near-unit shuttling success rates across the previously obstructed region and measure micromotion levels that remain within acceptable limits.","one_line_summary":"A Q-switched Nd:YAG 532 nm pulsed laser ablates transport-blocking defects in surface-electrode ion traps in situ, restoring near-unit shuttling success rates without interrupting vacuum operation.","pipeline_version":"pith-pipeline@v0.9.0","weakest_assumption":"The ablation removes the defect without creating new surface contaminants, charging, or structural damage that would degrade ion lifetime, coherence, or future shuttling performance over extended operation.","pith_extraction_headline":"A 532 nm pulsed laser removes transport-blocking defects from surface-electrode ion traps without breaking vacuum."},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/2605.06312/integrity.json","findings":[],"available":true,"detectors_run":[{"name":"claim_evidence","ran_at":"2026-05-20T12:42:04.076254Z","status":"completed","version":"1.0.0","findings_count":0},{"name":"ai_meta_artifact","ran_at":"2026-05-20T08:33:42.075357Z","status":"completed","version":"1.0.0","findings_count":0},{"name":"doi_title_agreement","ran_at":"2026-05-19T18:31:19.488437Z","status":"completed","version":"1.0.0","findings_count":0},{"name":"doi_compliance","ran_at":"2026-05-19T12:49:27.436885Z","status":"completed","version":"1.0.0","findings_count":0}],"snapshot_sha256":"e3e6ff3cacaeefb6a5c4e8cb035c3846fff445f7d2f040bd89defe1eacc7762a"},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"2605.06312","created_at":"2026-05-22T01:04:05.179933+00:00"},{"alias_kind":"arxiv_version","alias_value":"2605.06312v2","created_at":"2026-05-22T01:04:05.179933+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.2605.06312","created_at":"2026-05-22T01:04:05.179933+00:00"},{"alias_kind":"pith_short_12","alias_value":"EATJ2LDM2H5B","created_at":"2026-05-22T01:04:05.179933+00:00"},{"alias_kind":"pith_short_16","alias_value":"EATJ2LDM2H5BA5IG","created_at":"2026-05-22T01:04:05.179933+00:00"},{"alias_kind":"pith_short_8","alias_value":"EATJ2LDM","created_at":"2026-05-22T01:04:05.179933+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/EATJ2LDM2H5BA5IGMFPSI4RWTY","json":"https://pith.science/pith/EATJ2LDM2H5BA5IGMFPSI4RWTY.json","graph_json":"https://pith.science/api/pith-number/EATJ2LDM2H5BA5IGMFPSI4RWTY/graph.json","events_json":"https://pith.science/api/pith-number/EATJ2LDM2H5BA5IGMFPSI4RWTY/events.json","paper":"https://pith.science/paper/EATJ2LDM"},"agent_actions":{"view_html":"https://pith.science/pith/EATJ2LDM2H5BA5IGMFPSI4RWTY","download_json":"https://pith.science/pith/EATJ2LDM2H5BA5IGMFPSI4RWTY.json","view_paper":"https://pith.science/paper/EATJ2LDM","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=2605.06312&json=true","fetch_graph":"https://pith.science/api/pith-number/EATJ2LDM2H5BA5IGMFPSI4RWTY/graph.json","fetch_events":"https://pith.science/api/pith-number/EATJ2LDM2H5BA5IGMFPSI4RWTY/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/EATJ2LDM2H5BA5IGMFPSI4RWTY/action/timestamp_anchor","attest_storage":"https://pith.science/pith/EATJ2LDM2H5BA5IGMFPSI4RWTY/action/storage_attestation","attest_author":"https://pith.science/pith/EATJ2LDM2H5BA5IGMFPSI4RWTY/action/author_attestation","sign_citation":"https://pith.science/pith/EATJ2LDM2H5BA5IGMFPSI4RWTY/action/citation_signature","submit_replication":"https://pith.science/pith/EATJ2LDM2H5BA5IGMFPSI4RWTY/action/replication_record"}},"created_at":"2026-05-22T01:04:05.179933+00:00","updated_at":"2026-05-22T01:04:05.179933+00:00"}