{"bundle_type":"pith_open_graph_bundle","bundle_version":"1.0","pith_number":"pith:2019:HFYNXWYWETBZY35CY2WI5GRL7K","short_pith_number":"pith:HFYNXWYW","canonical_record":{"source":{"id":"1904.11732","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.app-ph","submitted_at":"2019-04-26T09:25:05Z","cross_cats_sorted":[],"title_canon_sha256":"e2bc7a6bb01f4fccfc89721bba677b2dc1658bcb5f5b3f3232079865834bd20f","abstract_canon_sha256":"66a94c666e8ebab15ed982b84dd6e76710821dad6dbb38a20eaef190baea2004"},"schema_version":"1.0"},"canonical_sha256":"3970dbdb1624c39c6fa2c6ac8e9a2bfa83434111864ace95c1ae3999d3ed028e","source":{"kind":"arxiv","id":"1904.11732","version":1},"source_aliases":[{"alias_kind":"arxiv","alias_value":"1904.11732","created_at":"2026-05-17T23:47:41Z"},{"alias_kind":"arxiv_version","alias_value":"1904.11732v1","created_at":"2026-05-17T23:47:41Z"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.1904.11732","created_at":"2026-05-17T23:47:41Z"},{"alias_kind":"pith_short_12","alias_value":"HFYNXWYWETBZ","created_at":"2026-05-18T12:33:18Z"},{"alias_kind":"pith_short_16","alias_value":"HFYNXWYWETBZY35C","created_at":"2026-05-18T12:33:18Z"},{"alias_kind":"pith_short_8","alias_value":"HFYNXWYW","created_at":"2026-05-18T12:33:18Z"}],"events":[{"event_type":"record_created","subject_pith_number":"pith:2019:HFYNXWYWETBZY35CY2WI5GRL7K","target":"record","payload":{"canonical_record":{"source":{"id":"1904.11732","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.app-ph","submitted_at":"2019-04-26T09:25:05Z","cross_cats_sorted":[],"title_canon_sha256":"e2bc7a6bb01f4fccfc89721bba677b2dc1658bcb5f5b3f3232079865834bd20f","abstract_canon_sha256":"66a94c666e8ebab15ed982b84dd6e76710821dad6dbb38a20eaef190baea2004"},"schema_version":"1.0"},"canonical_sha256":"3970dbdb1624c39c6fa2c6ac8e9a2bfa83434111864ace95c1ae3999d3ed028e","receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-17T23:47:41.095551Z","signature_b64":"zxpVls8uRV7vXtxkw03NGptpUrO9JDGkjmT7OMJp/NoQSaYnhDjMUOK5UcIDOCLAkTQsJBfkLVxxyPGjMGG4DQ==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"3970dbdb1624c39c6fa2c6ac8e9a2bfa83434111864ace95c1ae3999d3ed028e","last_reissued_at":"2026-05-17T23:47:41.094912Z","signature_status":"signed_v1","first_computed_at":"2026-05-17T23:47:41.094912Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"source_kind":"arxiv","source_id":"1904.11732","source_version":1,"attestation_state":"computed"},"signer":{"signer_id":"pith.science","signer_type":"pith_registry","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"created_at":"2026-05-17T23:47:41Z","supersedes":[],"prev_event":null,"signature":{"signature_status":"signed_v1","algorithm":"ed25519","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signature_b64":"PuZxy3YW1Kje7QeEPvDkLXeA10fR1n1+Kg9h/DC+UnqJaQPA9GHfqZ/8Fsd4e7rhew9q4VPHM/a5JIG2CPfNCA==","signed_message":"open_graph_event_sha256_bytes","signed_at":"2026-06-21T22:27:47.035168Z"},"content_sha256":"9b54e08b66dc5edc6ca8faffea267c2c90e4896b074d5640f83a10ea5b308123","schema_version":"1.0","event_id":"sha256:9b54e08b66dc5edc6ca8faffea267c2c90e4896b074d5640f83a10ea5b308123"},{"event_type":"graph_snapshot","subject_pith_number":"pith:2019:HFYNXWYWETBZY35CY2WI5GRL7K","target":"graph","payload":{"graph_snapshot":{"paper":{"title":"Quantifying the Damage Induced by XPS Depth Profiling of Organic Conjugated Polymers","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"physics.app-ph","authors_text":"Yana Vaynzof, Yvonne J. Hofstetter","submitted_at":"2019-04-26T09:25:05Z","abstract_excerpt":"X-ray photoemission spectroscopy (XPS) depth profiling using monoatomic Ar+ ion etching sources is a common technique that allows for the probing of the vertical compositional profiles of a wide range of materials. In polymer-based organic photovoltaic devices, it is commonly used to study compositional variations across the interfaces of the organic active layer with charge extraction layers or electrodes, as well as the vertical phase separation within the bulk-heterojunction active layer. It is generally considered that the damage induced by the etching of organic layers is limited to the v"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1904.11732","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"verdict_id":null},"signer":{"signer_id":"pith.science","signer_type":"pith_registry","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"created_at":"2026-05-17T23:47:41Z","supersedes":[],"prev_event":null,"signature":{"signature_status":"signed_v1","algorithm":"ed25519","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signature_b64":"/n9u2QjbAJbZrCnq1fFlNB2SlLx2XHaJJImr1vyb9m90z6UQxr+A9nI5XQ9UslDllt4TKd6WrOk+MKT+JPEkDA==","signed_message":"open_graph_event_sha256_bytes","signed_at":"2026-06-21T22:27:47.035522Z"},"content_sha256":"85c1e857c12cfc87615d7dd4c448aab94d16364b1fa7b28bd712116e6921ab77","schema_version":"1.0","event_id":"sha256:85c1e857c12cfc87615d7dd4c448aab94d16364b1fa7b28bd712116e6921ab77"}],"timestamp_proofs":[],"mirror_hints":[{"mirror_type":"https","name":"Pith Resolver","base_url":"https://pith.science","bundle_url":"https://pith.science/pith/HFYNXWYWETBZY35CY2WI5GRL7K/bundle.json","state_url":"https://pith.science/pith/HFYNXWYWETBZY35CY2WI5GRL7K/state.json","well_known_bundle_url":"https://pith.science/.well-known/pith/HFYNXWYWETBZY35CY2WI5GRL7K/bundle.json","status":"primary"}],"public_keys":[{"key_id":"pith-v1-2026-05","algorithm":"ed25519","format":"raw","public_key_b64":"stVStoiQhXFxp4s2pdzPNoqVNBMojDU/fJ2db5S3CbM=","public_key_hex":"b2d552b68890857171a78b36a5dccf368a953413288c353f7c9d9d6f94b709b3","fingerprint_sha256_b32_first128bits":"RVFV5Z2OI2J3ZUO7ERDEBCYNKS","fingerprint_sha256_hex":"8d4b5ee74e4693bcd1df2446408b0d54","rotates_at":null,"url":"https://pith.science/pith-signing-key.json","notes":"Pith uses this Ed25519 key to sign canonical record SHA-256 digests. Verify with: ed25519_verify(public_key, message=canonical_sha256_bytes, signature=base64decode(signature_b64))."}],"merge_version":"pith-open-graph-merge-v1","built_at":"2026-06-21T22:27:47Z","links":{"resolver":"https://pith.science/pith/HFYNXWYWETBZY35CY2WI5GRL7K","bundle":"https://pith.science/pith/HFYNXWYWETBZY35CY2WI5GRL7K/bundle.json","state":"https://pith.science/pith/HFYNXWYWETBZY35CY2WI5GRL7K/state.json","well_known_bundle":"https://pith.science/.well-known/pith/HFYNXWYWETBZY35CY2WI5GRL7K/bundle.json"},"state":{"state_type":"pith_open_graph_state","state_version":"1.0","pith_number":"pith:2019:HFYNXWYWETBZY35CY2WI5GRL7K","merge_version":"pith-open-graph-merge-v1","event_count":2,"valid_event_count":2,"invalid_event_count":0,"equivocation_count":0,"current":{"canonical_record":{"metadata":{"abstract_canon_sha256":"66a94c666e8ebab15ed982b84dd6e76710821dad6dbb38a20eaef190baea2004","cross_cats_sorted":[],"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.app-ph","submitted_at":"2019-04-26T09:25:05Z","title_canon_sha256":"e2bc7a6bb01f4fccfc89721bba677b2dc1658bcb5f5b3f3232079865834bd20f"},"schema_version":"1.0","source":{"id":"1904.11732","kind":"arxiv","version":1}},"source_aliases":[{"alias_kind":"arxiv","alias_value":"1904.11732","created_at":"2026-05-17T23:47:41Z"},{"alias_kind":"arxiv_version","alias_value":"1904.11732v1","created_at":"2026-05-17T23:47:41Z"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.1904.11732","created_at":"2026-05-17T23:47:41Z"},{"alias_kind":"pith_short_12","alias_value":"HFYNXWYWETBZ","created_at":"2026-05-18T12:33:18Z"},{"alias_kind":"pith_short_16","alias_value":"HFYNXWYWETBZY35C","created_at":"2026-05-18T12:33:18Z"},{"alias_kind":"pith_short_8","alias_value":"HFYNXWYW","created_at":"2026-05-18T12:33:18Z"}],"graph_snapshots":[{"event_id":"sha256:85c1e857c12cfc87615d7dd4c448aab94d16364b1fa7b28bd712116e6921ab77","target":"graph","created_at":"2026-05-17T23:47:41Z","signer":{"key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signer_id":"pith.science","signer_type":"pith_registry"},"payload":{"graph_snapshot":{"author_claims":{"count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","strong_count":0},"builder_version":"pith-number-builder-2026-05-17-v1","claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"paper":{"abstract_excerpt":"X-ray photoemission spectroscopy (XPS) depth profiling using monoatomic Ar+ ion etching sources is a common technique that allows for the probing of the vertical compositional profiles of a wide range of materials. In polymer-based organic photovoltaic devices, it is commonly used to study compositional variations across the interfaces of the organic active layer with charge extraction layers or electrodes, as well as the vertical phase separation within the bulk-heterojunction active layer. It is generally considered that the damage induced by the etching of organic layers is limited to the v","authors_text":"Yana Vaynzof, Yvonne J. Hofstetter","cross_cats":[],"headline":"","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.app-ph","submitted_at":"2019-04-26T09:25:05Z","title":"Quantifying the Damage Induced by XPS Depth Profiling of Organic Conjugated Polymers"},"references":{"count":0,"internal_anchors":0,"resolved_work":0,"sample":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1904.11732","kind":"arxiv","version":1},"verdict":{"created_at":null,"id":null,"model_set":{},"one_line_summary":"","pipeline_version":null,"pith_extraction_headline":"","strongest_claim":"","weakest_assumption":""}},"verdict_id":null}}],"author_attestations":[],"timestamp_anchors":[],"storage_attestations":[],"citation_signatures":[],"replication_records":[],"corrections":[],"mirror_hints":[],"record_created":{"event_id":"sha256:9b54e08b66dc5edc6ca8faffea267c2c90e4896b074d5640f83a10ea5b308123","target":"record","created_at":"2026-05-17T23:47:41Z","signer":{"key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signer_id":"pith.science","signer_type":"pith_registry"},"payload":{"attestation_state":"computed","canonical_record":{"metadata":{"abstract_canon_sha256":"66a94c666e8ebab15ed982b84dd6e76710821dad6dbb38a20eaef190baea2004","cross_cats_sorted":[],"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.app-ph","submitted_at":"2019-04-26T09:25:05Z","title_canon_sha256":"e2bc7a6bb01f4fccfc89721bba677b2dc1658bcb5f5b3f3232079865834bd20f"},"schema_version":"1.0","source":{"id":"1904.11732","kind":"arxiv","version":1}},"canonical_sha256":"3970dbdb1624c39c6fa2c6ac8e9a2bfa83434111864ace95c1ae3999d3ed028e","receipt":{"algorithm":"ed25519","builder_version":"pith-number-builder-2026-05-17-v1","canonical_sha256":"3970dbdb1624c39c6fa2c6ac8e9a2bfa83434111864ace95c1ae3999d3ed028e","first_computed_at":"2026-05-17T23:47:41.094912Z","key_id":"pith-v1-2026-05","kind":"pith_receipt","last_reissued_at":"2026-05-17T23:47:41.094912Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","receipt_version":"0.3","signature_b64":"zxpVls8uRV7vXtxkw03NGptpUrO9JDGkjmT7OMJp/NoQSaYnhDjMUOK5UcIDOCLAkTQsJBfkLVxxyPGjMGG4DQ==","signature_status":"signed_v1","signed_at":"2026-05-17T23:47:41.095551Z","signed_message":"canonical_sha256_bytes"},"source_id":"1904.11732","source_kind":"arxiv","source_version":1}}},"equivocations":[],"invalid_events":[],"applied_event_ids":["sha256:9b54e08b66dc5edc6ca8faffea267c2c90e4896b074d5640f83a10ea5b308123","sha256:85c1e857c12cfc87615d7dd4c448aab94d16364b1fa7b28bd712116e6921ab77"],"state_sha256":"95db83338c927d0dfd7165091503156054ec2fa95034277d1d988e43ce532733"},"bundle_signature":{"signature_status":"signed_v1","algorithm":"ed25519","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signature_b64":"OfyB8GMK04cC0pT7KCPQEwKLJWXtgCLM264Uf1OwKsWUyNo6XwDecLxrRt16N3T4gIy7AMdQ3up+rtugMhJbBw==","signed_message":"bundle_sha256_bytes","signed_at":"2026-06-21T22:27:47.037401Z","bundle_sha256":"070abc5315d29e22c12dd0cd0f5272caf2f6f0c2a291ef52ca2dd8a918c86b90"}}