{"bundle_type":"pith_open_graph_bundle","bundle_version":"1.0","pith_number":"pith:2016:INCWGLMRXHWDTAUUKNKVLAOZBS","short_pith_number":"pith:INCWGLMR","canonical_record":{"source":{"id":"1606.05402","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.optics","submitted_at":"2016-06-17T01:52:20Z","cross_cats_sorted":[],"title_canon_sha256":"6f2beb097bcf652c9dd7320ee98580c63a4914de624a427ce873eeb29a481c1f","abstract_canon_sha256":"c6088cf274c790f1550ea477ebdde999fa4561b87ca0d2595ef7d58303feb171"},"schema_version":"1.0"},"canonical_sha256":"4345632d91b9ec39829453555581d90cae693e5975327e0066ea44dbe7fa95ad","source":{"kind":"arxiv","id":"1606.05402","version":1},"source_aliases":[{"alias_kind":"arxiv","alias_value":"1606.05402","created_at":"2026-05-18T01:12:20Z"},{"alias_kind":"arxiv_version","alias_value":"1606.05402v1","created_at":"2026-05-18T01:12:20Z"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.1606.05402","created_at":"2026-05-18T01:12:20Z"},{"alias_kind":"pith_short_12","alias_value":"INCWGLMRXHWD","created_at":"2026-05-18T12:30:22Z"},{"alias_kind":"pith_short_16","alias_value":"INCWGLMRXHWDTAUU","created_at":"2026-05-18T12:30:22Z"},{"alias_kind":"pith_short_8","alias_value":"INCWGLMR","created_at":"2026-05-18T12:30:22Z"}],"events":[{"event_type":"record_created","subject_pith_number":"pith:2016:INCWGLMRXHWDTAUUKNKVLAOZBS","target":"record","payload":{"canonical_record":{"source":{"id":"1606.05402","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.optics","submitted_at":"2016-06-17T01:52:20Z","cross_cats_sorted":[],"title_canon_sha256":"6f2beb097bcf652c9dd7320ee98580c63a4914de624a427ce873eeb29a481c1f","abstract_canon_sha256":"c6088cf274c790f1550ea477ebdde999fa4561b87ca0d2595ef7d58303feb171"},"schema_version":"1.0"},"canonical_sha256":"4345632d91b9ec39829453555581d90cae693e5975327e0066ea44dbe7fa95ad","receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-18T01:12:20.211338Z","signature_b64":"jFkjan12Nz2PpW7NLJiFFkDsLr0QD4rB9CE9ClDcQqIF0mla8Crka20CKZEnOB0KNOE3BSrn5QleYeh4AN30DQ==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"4345632d91b9ec39829453555581d90cae693e5975327e0066ea44dbe7fa95ad","last_reissued_at":"2026-05-18T01:12:20.210876Z","signature_status":"signed_v1","first_computed_at":"2026-05-18T01:12:20.210876Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"source_kind":"arxiv","source_id":"1606.05402","source_version":1,"attestation_state":"computed"},"signer":{"signer_id":"pith.science","signer_type":"pith_registry","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"created_at":"2026-05-18T01:12:20Z","supersedes":[],"prev_event":null,"signature":{"signature_status":"signed_v1","algorithm":"ed25519","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signature_b64":"516EFhH+vVJtLrCkWIaw9x7XDBAMhaAiO32eVOCZs6gKJ+rj1PAyAHBcrZeX4uG3qaDixQ4EGl5Dcwg1Ou86Aw==","signed_message":"open_graph_event_sha256_bytes","signed_at":"2026-06-11T14:20:47.113990Z"},"content_sha256":"280ab7842187eb2e68730270981f41445da5c0cd4e012842d2f95d1456092db9","schema_version":"1.0","event_id":"sha256:280ab7842187eb2e68730270981f41445da5c0cd4e012842d2f95d1456092db9"},{"event_type":"graph_snapshot","subject_pith_number":"pith:2016:INCWGLMRXHWDTAUUKNKVLAOZBS","target":"graph","payload":{"graph_snapshot":{"paper":{"title":"Interference-aided spectrum fitting method for accurately film thickness determination","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"physics.optics","authors_text":"Hui Xia, Ruonan Ji, Shao-Wei Wang, Tianxin Li, Wei Lu, Xingxing Liu, Xutao Zhang","submitted_at":"2016-06-17T01:52:20Z","abstract_excerpt":"A new approach was proposed to accurately determine the thickness of film, especially for ultra-thin film, through spectrum fitting with the assistance of interference layer. The determination limit can reach even less than 1 nm. Its accuracy is far better than traditional methods. This determination method is verified by experiments and the determination limit is at least 3.5 nm compared with the results of AFM. Furthermore, double-interference-aided spectra fitting method is proposed to reduce the requirements of determination instruments, which allow one to determine the film thickness with"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1606.05402","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"verdict_id":null},"signer":{"signer_id":"pith.science","signer_type":"pith_registry","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"created_at":"2026-05-18T01:12:20Z","supersedes":[],"prev_event":null,"signature":{"signature_status":"signed_v1","algorithm":"ed25519","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signature_b64":"sa0gw1f2fk8NOQ59eP/Fkm+ERGl+1+TatpeGtLx0JDUx7Ygk+7Jggfk93qBa29XSt1sqvD0WfkyZjZqk2AXGAg==","signed_message":"open_graph_event_sha256_bytes","signed_at":"2026-06-11T14:20:47.114349Z"},"content_sha256":"9b8a5e49107d5cfe961582d8dea11dcf3bc735020e343dbd5a8651d5d3ff5da4","schema_version":"1.0","event_id":"sha256:9b8a5e49107d5cfe961582d8dea11dcf3bc735020e343dbd5a8651d5d3ff5da4"}],"timestamp_proofs":[],"mirror_hints":[{"mirror_type":"https","name":"Pith Resolver","base_url":"https://pith.science","bundle_url":"https://pith.science/pith/INCWGLMRXHWDTAUUKNKVLAOZBS/bundle.json","state_url":"https://pith.science/pith/INCWGLMRXHWDTAUUKNKVLAOZBS/state.json","well_known_bundle_url":"https://pith.science/.well-known/pith/INCWGLMRXHWDTAUUKNKVLAOZBS/bundle.json","status":"primary"}],"public_keys":[{"key_id":"pith-v1-2026-05","algorithm":"ed25519","format":"raw","public_key_b64":"stVStoiQhXFxp4s2pdzPNoqVNBMojDU/fJ2db5S3CbM=","public_key_hex":"b2d552b68890857171a78b36a5dccf368a953413288c353f7c9d9d6f94b709b3","fingerprint_sha256_b32_first128bits":"RVFV5Z2OI2J3ZUO7ERDEBCYNKS","fingerprint_sha256_hex":"8d4b5ee74e4693bcd1df2446408b0d54","rotates_at":null,"url":"https://pith.science/pith-signing-key.json","notes":"Pith uses this Ed25519 key to sign canonical record SHA-256 digests. Verify with: ed25519_verify(public_key, message=canonical_sha256_bytes, signature=base64decode(signature_b64))."}],"merge_version":"pith-open-graph-merge-v1","built_at":"2026-06-11T14:20:47Z","links":{"resolver":"https://pith.science/pith/INCWGLMRXHWDTAUUKNKVLAOZBS","bundle":"https://pith.science/pith/INCWGLMRXHWDTAUUKNKVLAOZBS/bundle.json","state":"https://pith.science/pith/INCWGLMRXHWDTAUUKNKVLAOZBS/state.json","well_known_bundle":"https://pith.science/.well-known/pith/INCWGLMRXHWDTAUUKNKVLAOZBS/bundle.json"},"state":{"state_type":"pith_open_graph_state","state_version":"1.0","pith_number":"pith:2016:INCWGLMRXHWDTAUUKNKVLAOZBS","merge_version":"pith-open-graph-merge-v1","event_count":2,"valid_event_count":2,"invalid_event_count":0,"equivocation_count":0,"current":{"canonical_record":{"metadata":{"abstract_canon_sha256":"c6088cf274c790f1550ea477ebdde999fa4561b87ca0d2595ef7d58303feb171","cross_cats_sorted":[],"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.optics","submitted_at":"2016-06-17T01:52:20Z","title_canon_sha256":"6f2beb097bcf652c9dd7320ee98580c63a4914de624a427ce873eeb29a481c1f"},"schema_version":"1.0","source":{"id":"1606.05402","kind":"arxiv","version":1}},"source_aliases":[{"alias_kind":"arxiv","alias_value":"1606.05402","created_at":"2026-05-18T01:12:20Z"},{"alias_kind":"arxiv_version","alias_value":"1606.05402v1","created_at":"2026-05-18T01:12:20Z"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.1606.05402","created_at":"2026-05-18T01:12:20Z"},{"alias_kind":"pith_short_12","alias_value":"INCWGLMRXHWD","created_at":"2026-05-18T12:30:22Z"},{"alias_kind":"pith_short_16","alias_value":"INCWGLMRXHWDTAUU","created_at":"2026-05-18T12:30:22Z"},{"alias_kind":"pith_short_8","alias_value":"INCWGLMR","created_at":"2026-05-18T12:30:22Z"}],"graph_snapshots":[{"event_id":"sha256:9b8a5e49107d5cfe961582d8dea11dcf3bc735020e343dbd5a8651d5d3ff5da4","target":"graph","created_at":"2026-05-18T01:12:20Z","signer":{"key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signer_id":"pith.science","signer_type":"pith_registry"},"payload":{"graph_snapshot":{"author_claims":{"count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","strong_count":0},"builder_version":"pith-number-builder-2026-05-17-v1","claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"paper":{"abstract_excerpt":"A new approach was proposed to accurately determine the thickness of film, especially for ultra-thin film, through spectrum fitting with the assistance of interference layer. The determination limit can reach even less than 1 nm. Its accuracy is far better than traditional methods. This determination method is verified by experiments and the determination limit is at least 3.5 nm compared with the results of AFM. Furthermore, double-interference-aided spectra fitting method is proposed to reduce the requirements of determination instruments, which allow one to determine the film thickness with","authors_text":"Hui Xia, Ruonan Ji, Shao-Wei Wang, Tianxin Li, Wei Lu, Xingxing Liu, Xutao Zhang","cross_cats":[],"headline":"","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.optics","submitted_at":"2016-06-17T01:52:20Z","title":"Interference-aided spectrum fitting method for accurately film thickness determination"},"references":{"count":0,"internal_anchors":0,"resolved_work":0,"sample":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1606.05402","kind":"arxiv","version":1},"verdict":{"created_at":null,"id":null,"model_set":{},"one_line_summary":"","pipeline_version":null,"pith_extraction_headline":"","strongest_claim":"","weakest_assumption":""}},"verdict_id":null}}],"author_attestations":[],"timestamp_anchors":[],"storage_attestations":[],"citation_signatures":[],"replication_records":[],"corrections":[],"mirror_hints":[],"record_created":{"event_id":"sha256:280ab7842187eb2e68730270981f41445da5c0cd4e012842d2f95d1456092db9","target":"record","created_at":"2026-05-18T01:12:20Z","signer":{"key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signer_id":"pith.science","signer_type":"pith_registry"},"payload":{"attestation_state":"computed","canonical_record":{"metadata":{"abstract_canon_sha256":"c6088cf274c790f1550ea477ebdde999fa4561b87ca0d2595ef7d58303feb171","cross_cats_sorted":[],"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.optics","submitted_at":"2016-06-17T01:52:20Z","title_canon_sha256":"6f2beb097bcf652c9dd7320ee98580c63a4914de624a427ce873eeb29a481c1f"},"schema_version":"1.0","source":{"id":"1606.05402","kind":"arxiv","version":1}},"canonical_sha256":"4345632d91b9ec39829453555581d90cae693e5975327e0066ea44dbe7fa95ad","receipt":{"algorithm":"ed25519","builder_version":"pith-number-builder-2026-05-17-v1","canonical_sha256":"4345632d91b9ec39829453555581d90cae693e5975327e0066ea44dbe7fa95ad","first_computed_at":"2026-05-18T01:12:20.210876Z","key_id":"pith-v1-2026-05","kind":"pith_receipt","last_reissued_at":"2026-05-18T01:12:20.210876Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","receipt_version":"0.3","signature_b64":"jFkjan12Nz2PpW7NLJiFFkDsLr0QD4rB9CE9ClDcQqIF0mla8Crka20CKZEnOB0KNOE3BSrn5QleYeh4AN30DQ==","signature_status":"signed_v1","signed_at":"2026-05-18T01:12:20.211338Z","signed_message":"canonical_sha256_bytes"},"source_id":"1606.05402","source_kind":"arxiv","source_version":1}}},"equivocations":[],"invalid_events":[],"applied_event_ids":["sha256:280ab7842187eb2e68730270981f41445da5c0cd4e012842d2f95d1456092db9","sha256:9b8a5e49107d5cfe961582d8dea11dcf3bc735020e343dbd5a8651d5d3ff5da4"],"state_sha256":"87c974d30c7128062fa9782da29a87bac0f8c4d01b063b971b54a0ff0180da16"},"bundle_signature":{"signature_status":"signed_v1","algorithm":"ed25519","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signature_b64":"1f99YeRQyn6ui1F1l1oxr4aVNZtrWTQmIGHkWbfysnmybA4S4ZE2qJxtZGBYaWwu/oy2Rt5AQar1wvc+DNSsDA==","signed_message":"bundle_sha256_bytes","signed_at":"2026-06-11T14:20:47.116255Z","bundle_sha256":"cf28f4a380877a9eef6efd6dbbafb2bd80b1f33e45b1506360d0abf42ae02ef8"}}