{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2025:IOV4FX4PY5MUVIJJ2HTPWMGMY2","short_pith_number":"pith:IOV4FX4P","schema_version":"1.0","canonical_sha256":"43abc2df8fc7594aa129d1e6fb30ccc6a4e1306d4584a18bc1ceebd060dd5946","source":{"kind":"arxiv","id":"2509.09375","version":1},"attestation_state":"computed","paper":{"title":"Unsupervised Integrated-Circuit Defect Segmentation via Image-Intrinsic Normality","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cs.CV","authors_text":"Botong Zhao, Qijun Shi, Shujing Lyu, Yue Lu","submitted_at":"2025-09-11T11:48:02Z","abstract_excerpt":"Modern Integrated-Circuit(IC) manufacturing introduces diverse, fine-grained defects that depress yield and reliability. Most industrial defect segmentation compares a test image against an external normal set, a strategy that is brittle for IC imagery where layouts vary across products and accurate alignment is difficult. We observe that defects are predominantly local, while each image still contains rich, repeatable normal patterns. We therefore propose an unsupervised IC defect segmentation framework that requires no external normal support. A learnable normal-information extractor aggrega"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"2509.09375","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"cs.CV","submitted_at":"2025-09-11T11:48:02Z","cross_cats_sorted":[],"title_canon_sha256":"f872b197cab077049a1234a31031cef90023f511ec63a237ba8591882727b40e","abstract_canon_sha256":"47aa632a1730240073282487a8ab9137835340ba325e247d05785b45360b6f93"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-07-05T12:09:35.076763Z","signature_b64":"/10leCo6iWkykIVIUc9KuQKs9WbGRM6USbOBEUmk4c2dBA+/UDyl0ohGDWdwfWWzQyLBVngcWeJIsgcUgdaZDw==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"43abc2df8fc7594aa129d1e6fb30ccc6a4e1306d4584a18bc1ceebd060dd5946","last_reissued_at":"2026-07-05T12:09:35.076274Z","signature_status":"signed_v1","first_computed_at":"2026-07-05T12:09:35.076274Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Unsupervised Integrated-Circuit Defect Segmentation via Image-Intrinsic Normality","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cs.CV","authors_text":"Botong Zhao, Qijun Shi, Shujing Lyu, Yue Lu","submitted_at":"2025-09-11T11:48:02Z","abstract_excerpt":"Modern Integrated-Circuit(IC) manufacturing introduces diverse, fine-grained defects that depress yield and reliability. Most industrial defect segmentation compares a test image against an external normal set, a strategy that is brittle for IC imagery where layouts vary across products and accurate alignment is difficult. We observe that defects are predominantly local, while each image still contains rich, repeatable normal patterns. We therefore propose an unsupervised IC defect segmentation framework that requires no external normal support. A learnable normal-information extractor aggrega"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"2509.09375","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/2509.09375/integrity.json","findings":[],"available":true,"detectors_run":[],"snapshot_sha256":"c28c3603d3b5d939e8dc4c7e95fa8dfce3d595e45f758748cecf8e644a296938"},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"2509.09375","created_at":"2026-07-05T12:09:35.076342+00:00"},{"alias_kind":"arxiv_version","alias_value":"2509.09375v1","created_at":"2026-07-05T12:09:35.076342+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.2509.09375","created_at":"2026-07-05T12:09:35.076342+00:00"},{"alias_kind":"pith_short_12","alias_value":"IOV4FX4PY5MU","created_at":"2026-07-05T12:09:35.076342+00:00"},{"alias_kind":"pith_short_16","alias_value":"IOV4FX4PY5MUVIJJ","created_at":"2026-07-05T12:09:35.076342+00:00"},{"alias_kind":"pith_short_8","alias_value":"IOV4FX4P","created_at":"2026-07-05T12:09:35.076342+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/IOV4FX4PY5MUVIJJ2HTPWMGMY2","json":"https://pith.science/pith/IOV4FX4PY5MUVIJJ2HTPWMGMY2.json","graph_json":"https://pith.science/api/pith-number/IOV4FX4PY5MUVIJJ2HTPWMGMY2/graph.json","events_json":"https://pith.science/api/pith-number/IOV4FX4PY5MUVIJJ2HTPWMGMY2/events.json","paper":"https://pith.science/paper/IOV4FX4P"},"agent_actions":{"view_html":"https://pith.science/pith/IOV4FX4PY5MUVIJJ2HTPWMGMY2","download_json":"https://pith.science/pith/IOV4FX4PY5MUVIJJ2HTPWMGMY2.json","view_paper":"https://pith.science/paper/IOV4FX4P","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=2509.09375&json=true","fetch_graph":"https://pith.science/api/pith-number/IOV4FX4PY5MUVIJJ2HTPWMGMY2/graph.json","fetch_events":"https://pith.science/api/pith-number/IOV4FX4PY5MUVIJJ2HTPWMGMY2/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/IOV4FX4PY5MUVIJJ2HTPWMGMY2/action/timestamp_anchor","attest_storage":"https://pith.science/pith/IOV4FX4PY5MUVIJJ2HTPWMGMY2/action/storage_attestation","attest_author":"https://pith.science/pith/IOV4FX4PY5MUVIJJ2HTPWMGMY2/action/author_attestation","sign_citation":"https://pith.science/pith/IOV4FX4PY5MUVIJJ2HTPWMGMY2/action/citation_signature","submit_replication":"https://pith.science/pith/IOV4FX4PY5MUVIJJ2HTPWMGMY2/action/replication_record"}},"created_at":"2026-07-05T12:09:35.076342+00:00","updated_at":"2026-07-05T12:09:35.076342+00:00"}