{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2022:J5X3CEOMSQAZVXNDJUPBAUA2LN","short_pith_number":"pith:J5X3CEOM","schema_version":"1.0","canonical_sha256":"4f6fb111cc94019adda34d1e10501a5b67f4de52f12d082705c163ba9cfbbdde","source":{"kind":"arxiv","id":"2208.01109","version":1},"attestation_state":"computed","paper":{"title":"Proton induced Dark Count Rate degradation in 150-nm CMOS Single-Photon Avalanche Diodes","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"physics.ins-det","authors_text":"A. Aloisio, D. Fiore, E. Sarnelli, F. Di Capua, M. Campajola","submitted_at":"2022-08-01T19:26:30Z","abstract_excerpt":"Proton irradiation effects on a Single-Photon Avalanche Diodes (SPADs) device manufactured using a 150-nm CMOS process are presented. An irradiation campaign has been carried out with protons of 20 MeV and 24 MeV on several samples of a test chip containing SPADs arrays with two different junction layouts. The dark count rate distributions have been analyzed as a function of the displacement damage dose. Annealing and cooling have been investigated as possible damage mitigation approaches. We also discuss, through a space radiation simulation, the suitability of such devices on several space m"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"2208.01109","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.ins-det","submitted_at":"2022-08-01T19:26:30Z","cross_cats_sorted":[],"title_canon_sha256":"28cac0587c408335ce3beb9f7f3f6334567d6ba8d10dbbf914e89b1360a68288","abstract_canon_sha256":"6eddb97b60b0dbfd4a541c51959b7b153a7eeef62bb1985b3ea45e58fb6838e1"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-07-05T04:45:29.581497Z","signature_b64":"4bDnjLMU8tBNxB/7oMSm0ctX0Ik0idZSSTYfPfdGO/KbnqUySeHN7hYAemuQbym0i8FqgGyAYLv+rHymeu3NAw==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"4f6fb111cc94019adda34d1e10501a5b67f4de52f12d082705c163ba9cfbbdde","last_reissued_at":"2026-07-05T04:45:29.581104Z","signature_status":"signed_v1","first_computed_at":"2026-07-05T04:45:29.581104Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Proton induced Dark Count Rate degradation in 150-nm CMOS Single-Photon Avalanche Diodes","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"physics.ins-det","authors_text":"A. Aloisio, D. Fiore, E. Sarnelli, F. Di Capua, M. Campajola","submitted_at":"2022-08-01T19:26:30Z","abstract_excerpt":"Proton irradiation effects on a Single-Photon Avalanche Diodes (SPADs) device manufactured using a 150-nm CMOS process are presented. An irradiation campaign has been carried out with protons of 20 MeV and 24 MeV on several samples of a test chip containing SPADs arrays with two different junction layouts. The dark count rate distributions have been analyzed as a function of the displacement damage dose. Annealing and cooling have been investigated as possible damage mitigation approaches. We also discuss, through a space radiation simulation, the suitability of such devices on several space m"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"2208.01109","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/2208.01109/integrity.json","findings":[],"available":true,"detectors_run":[],"snapshot_sha256":"c28c3603d3b5d939e8dc4c7e95fa8dfce3d595e45f758748cecf8e644a296938"},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"2208.01109","created_at":"2026-07-05T04:45:29.581160+00:00"},{"alias_kind":"arxiv_version","alias_value":"2208.01109v1","created_at":"2026-07-05T04:45:29.581160+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.2208.01109","created_at":"2026-07-05T04:45:29.581160+00:00"},{"alias_kind":"pith_short_12","alias_value":"J5X3CEOMSQAZ","created_at":"2026-07-05T04:45:29.581160+00:00"},{"alias_kind":"pith_short_16","alias_value":"J5X3CEOMSQAZVXND","created_at":"2026-07-05T04:45:29.581160+00:00"},{"alias_kind":"pith_short_8","alias_value":"J5X3CEOM","created_at":"2026-07-05T04:45:29.581160+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/J5X3CEOMSQAZVXNDJUPBAUA2LN","json":"https://pith.science/pith/J5X3CEOMSQAZVXNDJUPBAUA2LN.json","graph_json":"https://pith.science/api/pith-number/J5X3CEOMSQAZVXNDJUPBAUA2LN/graph.json","events_json":"https://pith.science/api/pith-number/J5X3CEOMSQAZVXNDJUPBAUA2LN/events.json","paper":"https://pith.science/paper/J5X3CEOM"},"agent_actions":{"view_html":"https://pith.science/pith/J5X3CEOMSQAZVXNDJUPBAUA2LN","download_json":"https://pith.science/pith/J5X3CEOMSQAZVXNDJUPBAUA2LN.json","view_paper":"https://pith.science/paper/J5X3CEOM","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=2208.01109&json=true","fetch_graph":"https://pith.science/api/pith-number/J5X3CEOMSQAZVXNDJUPBAUA2LN/graph.json","fetch_events":"https://pith.science/api/pith-number/J5X3CEOMSQAZVXNDJUPBAUA2LN/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/J5X3CEOMSQAZVXNDJUPBAUA2LN/action/timestamp_anchor","attest_storage":"https://pith.science/pith/J5X3CEOMSQAZVXNDJUPBAUA2LN/action/storage_attestation","attest_author":"https://pith.science/pith/J5X3CEOMSQAZVXNDJUPBAUA2LN/action/author_attestation","sign_citation":"https://pith.science/pith/J5X3CEOMSQAZVXNDJUPBAUA2LN/action/citation_signature","submit_replication":"https://pith.science/pith/J5X3CEOMSQAZVXNDJUPBAUA2LN/action/replication_record"}},"created_at":"2026-07-05T04:45:29.581160+00:00","updated_at":"2026-07-05T04:45:29.581160+00:00"}