{"bundle_type":"pith_open_graph_bundle","bundle_version":"1.0","pith_number":"pith:2026:JNYAWNO4SRWWLX3DMPP6DBNK6U","short_pith_number":"pith:JNYAWNO4","canonical_record":{"source":{"id":"2605.18386","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.ins-det","submitted_at":"2026-05-18T13:30:46Z","cross_cats_sorted":["cond-mat.mtrl-sci"],"title_canon_sha256":"55f24d532c2b197cd674e9b7f021de82dc119c0b841bbba65872c84b1c229787","abstract_canon_sha256":"fc28913a1a1a2b6ff1c850755b6318058b7c8a43e5b47935740e79fbb0e30002"},"schema_version":"1.0"},"canonical_sha256":"4b700b35dc946d65df6363dfe185aaf51a149e1fa622815064c796439f6cb338","source":{"kind":"arxiv","id":"2605.18386","version":1},"source_aliases":[{"alias_kind":"arxiv","alias_value":"2605.18386","created_at":"2026-05-20T00:05:58Z"},{"alias_kind":"arxiv_version","alias_value":"2605.18386v1","created_at":"2026-05-20T00:05:58Z"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.2605.18386","created_at":"2026-05-20T00:05:58Z"},{"alias_kind":"pith_short_12","alias_value":"JNYAWNO4SRWW","created_at":"2026-05-20T00:05:58Z"},{"alias_kind":"pith_short_16","alias_value":"JNYAWNO4SRWWLX3D","created_at":"2026-05-20T00:05:58Z"},{"alias_kind":"pith_short_8","alias_value":"JNYAWNO4","created_at":"2026-05-20T00:05:58Z"}],"events":[{"event_type":"record_created","subject_pith_number":"pith:2026:JNYAWNO4SRWWLX3DMPP6DBNK6U","target":"record","payload":{"canonical_record":{"source":{"id":"2605.18386","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.ins-det","submitted_at":"2026-05-18T13:30:46Z","cross_cats_sorted":["cond-mat.mtrl-sci"],"title_canon_sha256":"55f24d532c2b197cd674e9b7f021de82dc119c0b841bbba65872c84b1c229787","abstract_canon_sha256":"fc28913a1a1a2b6ff1c850755b6318058b7c8a43e5b47935740e79fbb0e30002"},"schema_version":"1.0"},"canonical_sha256":"4b700b35dc946d65df6363dfe185aaf51a149e1fa622815064c796439f6cb338","receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-20T00:05:58.274251Z","signature_b64":"ItK2TCaOT+5PlKltMSsh9AIK1vMtrCfPcTnS15LRHFcv6Sf+I/w6OhuoWBctzsAdXhSB3GSlLOVUiGF+SU92CA==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"4b700b35dc946d65df6363dfe185aaf51a149e1fa622815064c796439f6cb338","last_reissued_at":"2026-05-20T00:05:58.273327Z","signature_status":"signed_v1","first_computed_at":"2026-05-20T00:05:58.273327Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"source_kind":"arxiv","source_id":"2605.18386","source_version":1,"attestation_state":"computed"},"signer":{"signer_id":"pith.science","signer_type":"pith_registry","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"created_at":"2026-05-20T00:05:58Z","supersedes":[],"prev_event":null,"signature":{"signature_status":"signed_v1","algorithm":"ed25519","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signature_b64":"OkQfdxKGNOdPbHILXHMFQpVY3JlX9cQn07wMUR2PyWcV2r2NQcYmAoHQ9eSn/0Gatq6gWHiHZq7+UjJdj4UhCQ==","signed_message":"open_graph_event_sha256_bytes","signed_at":"2026-05-21T17:50:10.676735Z"},"content_sha256":"562eff9c7d59d969344046f4821d0cd7beb016f5be554ecb3b3e6bbc1ab9931d","schema_version":"1.0","event_id":"sha256:562eff9c7d59d969344046f4821d0cd7beb016f5be554ecb3b3e6bbc1ab9931d"},{"event_type":"graph_snapshot","subject_pith_number":"pith:2026:JNYAWNO4SRWWLX3DMPP6DBNK6U","target":"graph","payload":{"graph_snapshot":{"paper":{"title":"A single multi-configuration Direct Electron Detector for various electron imaging and diffraction-based techniques in SEM","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"A single orientable direct electron detector enables EBSD, RKD, TKD and imaging modes in one SEM","cross_cats":["cond-mat.mtrl-sci"],"primary_cat":"physics.ins-det","authors_text":"Julien Guyon (LEM3), Luc Morhain (LEM3), Nabila Maloufi (LEM3), Nathalie Gey (LEM3), Nohayla El-Khairaoui (LEM3)","submitted_at":"2026-05-18T13:30:46Z","abstract_excerpt":"Addressing the need for efficient and integrated multiscale crystallographic and defect analyses of advanced materials, this paper presents the implementation of a new multi-configuration detection system, integrating a single Timepix3-based direct electron detector (DED) in a scanning electron microscope (SEM). By combining precise translation and rotation movements, this system enables, for the first time, the use of the same detector to realize all principal diffraction geometries. These include conventional Electron BackScatter Diffraction (EBSD), off-axis Reflexion Kikuchi Diffraction (RK"},"claims":{"count":4,"items":[{"kind":"strongest_claim","text":"it is demonstrated that with a single DED assisted by an orientable support, it is possible to perform multiple advanced microstructural characterizations of both bulk samples and thin foils in the same SEM.","source":"verdict.strongest_claim","status":"machine_extracted","claim_id":"C1","attestation":"unclaimed"},{"kind":"weakest_assumption","text":"The assumption that precise translation and rotation movements combined with energy filtering and custom post-processing will consistently produce high-quality, easily indexable Kikuchi patterns and usable micrographs across all listed geometries without significant artifacts or loss of resolution.","source":"verdict.weakest_assumption","status":"machine_extracted","claim_id":"C2","attestation":"unclaimed"},{"kind":"one_line_summary","text":"A single orientable Timepix3 detector enables EBSD, RKD, TKD in multiple geometries plus BSE/ECCI/STEM-in-SEM imaging in one SEM for bulk and thin-foil samples.","source":"verdict.one_line_summary","status":"machine_extracted","claim_id":"C3","attestation":"unclaimed"},{"kind":"headline","text":"A single orientable direct electron detector enables EBSD, RKD, TKD and imaging modes in one SEM","source":"verdict.pith_extraction.headline","status":"machine_extracted","claim_id":"C4","attestation":"unclaimed"}],"snapshot_sha256":"a2446f2558ceea2e953e3af57b7f81550607eee46dcc9921beb1f5132846de85"},"source":{"id":"2605.18386","kind":"arxiv","version":1},"verdict":{"id":"99a725d8-d6f7-4ff6-ba73-a8a9177be214","model_set":{"reader":"grok-4.3"},"created_at":"2026-05-19T23:45:32.118857Z","strongest_claim":"it is demonstrated that with a single DED assisted by an orientable support, it is possible to perform multiple advanced microstructural characterizations of both bulk samples and thin foils in the same SEM.","one_line_summary":"A single orientable Timepix3 detector enables EBSD, RKD, TKD in multiple geometries plus BSE/ECCI/STEM-in-SEM imaging in one SEM for bulk and thin-foil samples.","pipeline_version":"pith-pipeline@v0.9.0","weakest_assumption":"The assumption that precise translation and rotation movements combined with energy filtering and custom post-processing will consistently produce high-quality, easily indexable Kikuchi patterns and usable micrographs across all listed geometries without significant artifacts or loss of resolution.","pith_extraction_headline":"A single orientable direct electron detector enables EBSD, RKD, TKD and imaging modes in one SEM"},"integrity":{"clean":false,"summary":{"advisory":1,"critical":0,"by_detector":{"doi_compliance":{"total":1,"advisory":1,"critical":0,"informational":0}},"informational":0},"endpoint":"/pith/2605.18386/integrity.json","findings":[{"note":"DOI in the printed bibliography is fragmented by whitespace or line breaks. A longer candidate (10.1016/j.ul-tramic.2017.12.017) was visible in the surrounding text but could not be confirmed against doi.org as printed.","detector":"doi_compliance","severity":"advisory","ref_index":6,"audited_at":"2026-05-19T23:51:48.991888Z","detected_doi":"10.1016/j.ul-tramic.2017.12.017","finding_type":"recoverable_identifier","verdict_class":"incontrovertible","detected_arxiv_id":null}],"available":true,"detectors_run":[{"name":"doi_title_agreement","ran_at":"2026-05-20T00:01:20.346660Z","status":"completed","version":"1.0.0","findings_count":0},{"name":"cited_work_retraction","ran_at":"2026-05-19T23:52:20.430747Z","status":"completed","version":"1.0.0","findings_count":0},{"name":"doi_compliance","ran_at":"2026-05-19T23:51:48.991888Z","status":"completed","version":"1.0.0","findings_count":1},{"name":"citation_quote_validity","ran_at":"2026-05-19T23:50:04.089164Z","status":"completed","version":"0.1.0","findings_count":0},{"name":"ai_meta_artifact","ran_at":"2026-05-19T23:33:29.762517Z","status":"skipped","version":"1.0.0","findings_count":0},{"name":"external_links","ran_at":"2026-05-19T23:31:45.545153Z","status":"completed","version":"1.0.0","findings_count":0},{"name":"claim_evidence","ran_at":"2026-05-19T23:21:58.750650Z","status":"completed","version":"1.0.0","findings_count":0}],"snapshot_sha256":"8724914b11782b26d0c5cb252508a5ac453c6a70ebe3b840640ab9cfcbd55d31"},"references":{"count":22,"sample":[{"doi":"10.1007/978-0-387-88136-2","year":2009,"title":"A.J. Schwartz, M. Kumar, B.L. Adams, D.P. Field, eds., Electron Backscatter Diffraction in Ma- terials Science, Springer US, Boston, MA, 2009. https://doi.org/10.1007/978-0-387-88136-2","work_id":"f1fde913-3c90-4d6e-aaad-678facc26c09","ref_index":1,"cited_arxiv_id":"","is_internal_anchor":false},{"doi":"10.1002/jemt.20293","year":2006,"title":"Crimp, Scanning electron microscopy imaging of dislocations in bulk materials, using elec- tron channeling contrast, Microscopy Res & Techniqu e 69 (2006) 374 –381","work_id":"d4f3db24-3ca0-4ceb-bb96-d1f701eb4ede","ref_index":2,"cited_arxiv_id":"","is_internal_anchor":false},{"doi":"10.1016/j.ceramint.2019.06.091","year":2019,"title":"H. Mansour, M.A. Crimp, N. Gey, X. Iltis, N. Maloufi, Dislocation analysis of a complex sub - grain boundary in UO2 ceramic using accurate electron channelling contrast imaging in a scan- ning electr ","work_id":"522947fb-2917-41b8-9ac5-5e59b4ec8758","ref_index":3,"cited_arxiv_id":"","is_internal_anchor":false},{"doi":"10.1111/j.1365-","year":2012,"title":"R.R. Keller, R.H. Geiss, Transmission EBSD from 10 nm domains in a scanning electron micro- scope, Journal of Microscopy 245 (2012) 245 –251. http s://doi.org/10.1111/j.1365- 2818.2011.03566.x","work_id":"9dc94162-eb07-47fa-adb9-09052f000e59","ref_index":4,"cited_arxiv_id":"","is_internal_anchor":false},{"doi":"","year":2022,"title":"https://analyticalscience.wiley.com/content/ar- ticle-do/stem-in-sem-re-emerging-material-measurement-approach (accessed March 19, 2026)","work_id":"76eb9f46-24a1-4ed3-bd44-2e9714dea97c","ref_index":5,"cited_arxiv_id":"","is_internal_anchor":false}],"resolved_work":22,"snapshot_sha256":"1cd677965007f248b3b1b463192c9dd50bba858b8c1b7530f59569f9e5d27bf3","internal_anchors":0},"formal_canon":{"evidence_count":2,"snapshot_sha256":"6632a14c4e9a409cd5fb22b1aea38a356a97cdf46c4f0df9ba535eacfc9fc9be"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"verdict_id":"99a725d8-d6f7-4ff6-ba73-a8a9177be214"},"signer":{"signer_id":"pith.science","signer_type":"pith_registry","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"created_at":"2026-05-20T00:05:58Z","supersedes":[],"prev_event":null,"signature":{"signature_status":"signed_v1","algorithm":"ed25519","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signature_b64":"R/3k2nAeDP/U2LNeZvjzmY5Qq0m+ITXKkSfWsprxdZlvV4Q2gZ/aZXzlL/HooMQjo6N4LY/dTyt7vw5Pv6C8Aw==","signed_message":"open_graph_event_sha256_bytes","signed_at":"2026-05-21T17:50:10.677576Z"},"content_sha256":"ba8093c34f9a317669f596d9d6fccc3fab20d123cb70b853754944ec7783ad86","schema_version":"1.0","event_id":"sha256:ba8093c34f9a317669f596d9d6fccc3fab20d123cb70b853754944ec7783ad86"},{"event_type":"integrity_finding","subject_pith_number":"pith:2026:JNYAWNO4SRWWLX3DMPP6DBNK6U","target":"integrity","payload":{"note":"DOI in the printed bibliography is fragmented by whitespace or line breaks. A longer candidate (10.1016/j.ul-tramic.2017.12.017) was visible in the surrounding text but could not be confirmed against doi.org as printed.","snippet":"F. Niessen, A. Burrows, A.B.D.S. Fanta, A systematic comparison of on-axis and off-axis trans- mission Kikuchi diffraction, Ultramicroscopy 186 (2018) 158 –170. https://doi.org/10.1016/j.ul- tramic.2017.12.017","arxiv_id":"2605.18386","detector":"doi_compliance","evidence":{"ref_index":6,"verdict_class":"incontrovertible","resolved_title":null,"printed_excerpt":"F. Niessen, A. Burrows, A.B.D.S. Fanta, A systematic comparison of on-axis and off-axis trans- mission Kikuchi diffraction, Ultramicroscopy 186 (2018) 158 –170. https://doi.org/10.1016/j.ul- tramic.2017.12.017","reconstructed_doi":"10.1016/j.ul-tramic.2017.12.017"},"severity":"advisory","ref_index":6,"audited_at":"2026-05-19T23:51:48.991888Z","event_type":"pith.integrity.v1","detected_doi":"10.1016/j.ul-tramic.2017.12.017","detector_url":"https://pith.science/pith-integrity-protocol#doi_compliance","external_url":null,"finding_type":"recoverable_identifier","evidence_hash":"db32b3f5e9fc9f7acec648ddf62ab410227f444aa00a659a8a8e3ad988dd1163","paper_version":1,"verdict_class":"incontrovertible","resolved_title":null,"detector_version":"1.0.0","detected_arxiv_id":null,"integrity_event_id":3721,"payload_sha256":"c719c94442cff6aedca297b66c04f1cb80c0d6f400768145f9d493a8f68fee35","signature_b64":"oOsggPuE4L6Ew0HDPHZDyIa/uH2/vgrk03gco3BiFxsq3kOwff9SYbSzhKOEbcqiaBdWpT7w3VTW59PH/BngBA==","signing_key_id":"pith-v1-2026-05"},"signer":{"signer_id":"pith.science","signer_type":"pith_registry","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"created_at":"2026-05-19T23:52:28Z","supersedes":[],"prev_event":null,"signature":{"signature_status":"signed_v1","algorithm":"ed25519","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signature_b64":"JtlfI8E+nOZjcb//E6Acr8gXZDIoFdxmsPdk3A+bH3wrzagkbwFgx2LzrpY93HlK3FrZMchprteP4M+ppnm/DQ==","signed_message":"open_graph_event_sha256_bytes","signed_at":"2026-05-21T17:50:10.678554Z"},"content_sha256":"b5e499275babfcc4a411a952c155a9dbbe7eee90f5f4c6677fddcc1fbbedb058","schema_version":"1.0","event_id":"sha256:b5e499275babfcc4a411a952c155a9dbbe7eee90f5f4c6677fddcc1fbbedb058"}],"timestamp_proofs":[],"mirror_hints":[{"mirror_type":"https","name":"Pith Resolver","base_url":"https://pith.science","bundle_url":"https://pith.science/pith/JNYAWNO4SRWWLX3DMPP6DBNK6U/bundle.json","state_url":"https://pith.science/pith/JNYAWNO4SRWWLX3DMPP6DBNK6U/state.json","well_known_bundle_url":"https://pith.science/.well-known/pith/JNYAWNO4SRWWLX3DMPP6DBNK6U/bundle.json","status":"primary"}],"public_keys":[{"key_id":"pith-v1-2026-05","algorithm":"ed25519","format":"raw","public_key_b64":"stVStoiQhXFxp4s2pdzPNoqVNBMojDU/fJ2db5S3CbM=","public_key_hex":"b2d552b68890857171a78b36a5dccf368a953413288c353f7c9d9d6f94b709b3","fingerprint_sha256_b32_first128bits":"RVFV5Z2OI2J3ZUO7ERDEBCYNKS","fingerprint_sha256_hex":"8d4b5ee74e4693bcd1df2446408b0d54","rotates_at":null,"url":"https://pith.science/pith-signing-key.json","notes":"Pith uses this Ed25519 key to sign canonical record SHA-256 digests. Verify with: ed25519_verify(public_key, message=canonical_sha256_bytes, signature=base64decode(signature_b64))."}],"merge_version":"pith-open-graph-merge-v1","built_at":"2026-05-21T17:50:10Z","links":{"resolver":"https://pith.science/pith/JNYAWNO4SRWWLX3DMPP6DBNK6U","bundle":"https://pith.science/pith/JNYAWNO4SRWWLX3DMPP6DBNK6U/bundle.json","state":"https://pith.science/pith/JNYAWNO4SRWWLX3DMPP6DBNK6U/state.json","well_known_bundle":"https://pith.science/.well-known/pith/JNYAWNO4SRWWLX3DMPP6DBNK6U/bundle.json"},"state":{"state_type":"pith_open_graph_state","state_version":"1.0","pith_number":"pith:2026:JNYAWNO4SRWWLX3DMPP6DBNK6U","merge_version":"pith-open-graph-merge-v1","event_count":3,"valid_event_count":3,"invalid_event_count":0,"equivocation_count":0,"current":{"canonical_record":{"metadata":{"abstract_canon_sha256":"fc28913a1a1a2b6ff1c850755b6318058b7c8a43e5b47935740e79fbb0e30002","cross_cats_sorted":["cond-mat.mtrl-sci"],"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.ins-det","submitted_at":"2026-05-18T13:30:46Z","title_canon_sha256":"55f24d532c2b197cd674e9b7f021de82dc119c0b841bbba65872c84b1c229787"},"schema_version":"1.0","source":{"id":"2605.18386","kind":"arxiv","version":1}},"source_aliases":[{"alias_kind":"arxiv","alias_value":"2605.18386","created_at":"2026-05-20T00:05:58Z"},{"alias_kind":"arxiv_version","alias_value":"2605.18386v1","created_at":"2026-05-20T00:05:58Z"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.2605.18386","created_at":"2026-05-20T00:05:58Z"},{"alias_kind":"pith_short_12","alias_value":"JNYAWNO4SRWW","created_at":"2026-05-20T00:05:58Z"},{"alias_kind":"pith_short_16","alias_value":"JNYAWNO4SRWWLX3D","created_at":"2026-05-20T00:05:58Z"},{"alias_kind":"pith_short_8","alias_value":"JNYAWNO4","created_at":"2026-05-20T00:05:58Z"}],"graph_snapshots":[{"event_id":"sha256:ba8093c34f9a317669f596d9d6fccc3fab20d123cb70b853754944ec7783ad86","target":"graph","created_at":"2026-05-20T00:05:58Z","signer":{"key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signer_id":"pith.science","signer_type":"pith_registry"},"payload":{"graph_snapshot":{"author_claims":{"count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","strong_count":0},"builder_version":"pith-number-builder-2026-05-17-v1","claims":{"count":4,"items":[{"attestation":"unclaimed","claim_id":"C1","kind":"strongest_claim","source":"verdict.strongest_claim","status":"machine_extracted","text":"it is demonstrated that with a single DED assisted by an orientable support, it is possible to perform multiple advanced microstructural characterizations of both bulk samples and thin foils in the same SEM."},{"attestation":"unclaimed","claim_id":"C2","kind":"weakest_assumption","source":"verdict.weakest_assumption","status":"machine_extracted","text":"The assumption that precise translation and rotation movements combined with energy filtering and custom post-processing will consistently produce high-quality, easily indexable Kikuchi patterns and usable micrographs across all listed geometries without significant artifacts or loss of resolution."},{"attestation":"unclaimed","claim_id":"C3","kind":"one_line_summary","source":"verdict.one_line_summary","status":"machine_extracted","text":"A single orientable Timepix3 detector enables EBSD, RKD, TKD in multiple geometries plus BSE/ECCI/STEM-in-SEM imaging in one SEM for bulk and thin-foil samples."},{"attestation":"unclaimed","claim_id":"C4","kind":"headline","source":"verdict.pith_extraction.headline","status":"machine_extracted","text":"A single orientable direct electron detector enables EBSD, RKD, TKD and imaging modes in one SEM"}],"snapshot_sha256":"a2446f2558ceea2e953e3af57b7f81550607eee46dcc9921beb1f5132846de85"},"formal_canon":{"evidence_count":2,"snapshot_sha256":"6632a14c4e9a409cd5fb22b1aea38a356a97cdf46c4f0df9ba535eacfc9fc9be"},"integrity":{"available":true,"clean":false,"detectors_run":[{"findings_count":0,"name":"doi_title_agreement","ran_at":"2026-05-20T00:01:20.346660Z","status":"completed","version":"1.0.0"},{"findings_count":0,"name":"cited_work_retraction","ran_at":"2026-05-19T23:52:20.430747Z","status":"completed","version":"1.0.0"},{"findings_count":1,"name":"doi_compliance","ran_at":"2026-05-19T23:51:48.991888Z","status":"completed","version":"1.0.0"},{"findings_count":0,"name":"citation_quote_validity","ran_at":"2026-05-19T23:50:04.089164Z","status":"completed","version":"0.1.0"},{"findings_count":0,"name":"ai_meta_artifact","ran_at":"2026-05-19T23:33:29.762517Z","status":"skipped","version":"1.0.0"},{"findings_count":0,"name":"external_links","ran_at":"2026-05-19T23:31:45.545153Z","status":"completed","version":"1.0.0"},{"findings_count":0,"name":"claim_evidence","ran_at":"2026-05-19T23:21:58.750650Z","status":"completed","version":"1.0.0"}],"endpoint":"/pith/2605.18386/integrity.json","findings":[{"audited_at":"2026-05-19T23:51:48.991888Z","detected_arxiv_id":null,"detected_doi":"10.1016/j.ul-tramic.2017.12.017","detector":"doi_compliance","finding_type":"recoverable_identifier","note":"DOI in the printed bibliography is fragmented by whitespace or line breaks. A longer candidate (10.1016/j.ul-tramic.2017.12.017) was visible in the surrounding text but could not be confirmed against doi.org as printed.","ref_index":6,"severity":"advisory","verdict_class":"incontrovertible"}],"snapshot_sha256":"8724914b11782b26d0c5cb252508a5ac453c6a70ebe3b840640ab9cfcbd55d31","summary":{"advisory":1,"by_detector":{"doi_compliance":{"advisory":1,"critical":0,"informational":0,"total":1}},"critical":0,"informational":0}},"paper":{"abstract_excerpt":"Addressing the need for efficient and integrated multiscale crystallographic and defect analyses of advanced materials, this paper presents the implementation of a new multi-configuration detection system, integrating a single Timepix3-based direct electron detector (DED) in a scanning electron microscope (SEM). By combining precise translation and rotation movements, this system enables, for the first time, the use of the same detector to realize all principal diffraction geometries. These include conventional Electron BackScatter Diffraction (EBSD), off-axis Reflexion Kikuchi Diffraction (RK","authors_text":"Julien Guyon (LEM3), Luc Morhain (LEM3), Nabila Maloufi (LEM3), Nathalie Gey (LEM3), Nohayla El-Khairaoui (LEM3)","cross_cats":["cond-mat.mtrl-sci"],"headline":"A single orientable direct electron detector enables EBSD, RKD, TKD and imaging modes in one SEM","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.ins-det","submitted_at":"2026-05-18T13:30:46Z","title":"A single multi-configuration Direct Electron Detector for various electron imaging and diffraction-based techniques in SEM"},"references":{"count":22,"internal_anchors":0,"resolved_work":22,"sample":[{"cited_arxiv_id":"","doi":"10.1007/978-0-387-88136-2","is_internal_anchor":false,"ref_index":1,"title":"A.J. Schwartz, M. Kumar, B.L. Adams, D.P. Field, eds., Electron Backscatter Diffraction in Ma- terials Science, Springer US, Boston, MA, 2009. https://doi.org/10.1007/978-0-387-88136-2","work_id":"f1fde913-3c90-4d6e-aaad-678facc26c09","year":2009},{"cited_arxiv_id":"","doi":"10.1002/jemt.20293","is_internal_anchor":false,"ref_index":2,"title":"Crimp, Scanning electron microscopy imaging of dislocations in bulk materials, using elec- tron channeling contrast, Microscopy Res & Techniqu e 69 (2006) 374 –381","work_id":"d4f3db24-3ca0-4ceb-bb96-d1f701eb4ede","year":2006},{"cited_arxiv_id":"","doi":"10.1016/j.ceramint.2019.06.091","is_internal_anchor":false,"ref_index":3,"title":"H. Mansour, M.A. Crimp, N. Gey, X. Iltis, N. Maloufi, Dislocation analysis of a complex sub - grain boundary in UO2 ceramic using accurate electron channelling contrast imaging in a scan- ning electr ","work_id":"522947fb-2917-41b8-9ac5-5e59b4ec8758","year":2019},{"cited_arxiv_id":"","doi":"10.1111/j.1365-","is_internal_anchor":false,"ref_index":4,"title":"R.R. Keller, R.H. Geiss, Transmission EBSD from 10 nm domains in a scanning electron micro- scope, Journal of Microscopy 245 (2012) 245 –251. http s://doi.org/10.1111/j.1365- 2818.2011.03566.x","work_id":"9dc94162-eb07-47fa-adb9-09052f000e59","year":2012},{"cited_arxiv_id":"","doi":"","is_internal_anchor":false,"ref_index":5,"title":"https://analyticalscience.wiley.com/content/ar- ticle-do/stem-in-sem-re-emerging-material-measurement-approach (accessed March 19, 2026)","work_id":"76eb9f46-24a1-4ed3-bd44-2e9714dea97c","year":2022}],"snapshot_sha256":"1cd677965007f248b3b1b463192c9dd50bba858b8c1b7530f59569f9e5d27bf3"},"source":{"id":"2605.18386","kind":"arxiv","version":1},"verdict":{"created_at":"2026-05-19T23:45:32.118857Z","id":"99a725d8-d6f7-4ff6-ba73-a8a9177be214","model_set":{"reader":"grok-4.3"},"one_line_summary":"A single orientable Timepix3 detector enables EBSD, RKD, TKD in multiple geometries plus BSE/ECCI/STEM-in-SEM imaging in one SEM for bulk and thin-foil samples.","pipeline_version":"pith-pipeline@v0.9.0","pith_extraction_headline":"A single orientable direct electron detector enables EBSD, RKD, TKD and imaging modes in one SEM","strongest_claim":"it is demonstrated that with a single DED assisted by an orientable support, it is possible to perform multiple advanced microstructural characterizations of both bulk samples and thin foils in the same SEM.","weakest_assumption":"The assumption that precise translation and rotation movements combined with energy filtering and custom post-processing will consistently produce high-quality, easily indexable Kikuchi patterns and usable micrographs across all listed geometries without significant artifacts or loss of resolution."}},"verdict_id":"99a725d8-d6f7-4ff6-ba73-a8a9177be214"}}],"author_attestations":[],"timestamp_anchors":[],"storage_attestations":[],"citation_signatures":[],"replication_records":[],"corrections":[],"mirror_hints":[],"record_created":{"event_id":"sha256:562eff9c7d59d969344046f4821d0cd7beb016f5be554ecb3b3e6bbc1ab9931d","target":"record","created_at":"2026-05-20T00:05:58Z","signer":{"key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signer_id":"pith.science","signer_type":"pith_registry"},"payload":{"attestation_state":"computed","canonical_record":{"metadata":{"abstract_canon_sha256":"fc28913a1a1a2b6ff1c850755b6318058b7c8a43e5b47935740e79fbb0e30002","cross_cats_sorted":["cond-mat.mtrl-sci"],"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.ins-det","submitted_at":"2026-05-18T13:30:46Z","title_canon_sha256":"55f24d532c2b197cd674e9b7f021de82dc119c0b841bbba65872c84b1c229787"},"schema_version":"1.0","source":{"id":"2605.18386","kind":"arxiv","version":1}},"canonical_sha256":"4b700b35dc946d65df6363dfe185aaf51a149e1fa622815064c796439f6cb338","receipt":{"algorithm":"ed25519","builder_version":"pith-number-builder-2026-05-17-v1","canonical_sha256":"4b700b35dc946d65df6363dfe185aaf51a149e1fa622815064c796439f6cb338","first_computed_at":"2026-05-20T00:05:58.273327Z","key_id":"pith-v1-2026-05","kind":"pith_receipt","last_reissued_at":"2026-05-20T00:05:58.273327Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","receipt_version":"0.3","signature_b64":"ItK2TCaOT+5PlKltMSsh9AIK1vMtrCfPcTnS15LRHFcv6Sf+I/w6OhuoWBctzsAdXhSB3GSlLOVUiGF+SU92CA==","signature_status":"signed_v1","signed_at":"2026-05-20T00:05:58.274251Z","signed_message":"canonical_sha256_bytes"},"source_id":"2605.18386","source_kind":"arxiv","source_version":1}}},"equivocations":[],"invalid_events":[],"applied_event_ids":["sha256:b5e499275babfcc4a411a952c155a9dbbe7eee90f5f4c6677fddcc1fbbedb058","sha256:562eff9c7d59d969344046f4821d0cd7beb016f5be554ecb3b3e6bbc1ab9931d","sha256:ba8093c34f9a317669f596d9d6fccc3fab20d123cb70b853754944ec7783ad86"],"state_sha256":"6cce9ddd856598c8986df7d84b8d0c7a9862c2e1afa50c90c6d720266eaa6fd6"},"bundle_signature":{"signature_status":"signed_v1","algorithm":"ed25519","key_id":"pith-v1-2026-05","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54","signature_b64":"uhezUkPWuYghZN80AEhIMs/o5LMl8ZR/m8oKH4Dve/8uZXc++BUjbzGDres8PHnfW0VZaL+4ueYjUJiaTsg3Aw==","signed_message":"bundle_sha256_bytes","signed_at":"2026-05-21T17:50:10.681587Z","bundle_sha256":"6e0aca41a93f50ebfc51b7b371be28d83ee557366a86cf816784105f44f8c35e"}}