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Loebell, J. Schieck, J. Schmaler, K. Rottler, K. Sch\\\"affner, L. Canonica, L. Stodolsky, M. Bauer, M. Kiefer, M. Kimmerle, M. Uffinger, M. v. Sivers, M. Willers, M. W\\\"ustrich, N. Ferreiro Iachellini, P. Bauer, P. Gorla, P. Huff, R. Strauss, S. Pfister, S. Roth, S. Scholl, S. Sch\\\"onert, S. Wawoczny, V. Tretyak, W. Potzel, W. Seidel, X. Defay","submitted_at":"2016-04-28T16:20:56Z","abstract_excerpt":"We analyzed low-background data from the CRESST-II experiment with a total net exposure of 730 kg days to extract limits on double electron capture processes. We established new limits for $^{40}$Ca with $T_{1/2}^{2v2K}>9.9\\times10^{21}$ y and $T_{1/2}^{0v2EC}>1.4\\times10^{22}$ y and for $^{180}$W with T$_{1/2}^{2v2K}>3.1\\times10^{19}$ y and $T_{1/2}^{0v2EC}>9.4\\times10^{18}$ y at 90% CL. 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Bento, A. Erb, A. G\\\"utlein, A M\\\"unster, A. Tanzke, A. Ulrich, A. Z\\\"oller, C. Bucci, C. Ciemniak, C. Isaila, C. Pagliarone, C. Sailer, C. Strandhagen, C. T\\\"urko\\u{g}lu, D. Hauff, F. Petricca, F. Pr\\\"obst, F. Reindl, F. v. Feilitzsch, G. Angloher, G. Deuter, H. H. Trinh Thi, H. Kluck, H. Kraus, I. Bavykina, I. Usherov, J.-C. Lanfranchi, J. Jochum, J. Loebell, J. Schieck, J. Schmaler, K. Rottler, K. Sch\\\"affner, L. Canonica, L. Stodolsky, M. Bauer, M. Kiefer, M. Kimmerle, M. Uffinger, M. v. Sivers, M. Willers, M. W\\\"ustrich, N. Ferreiro Iachellini, P. Bauer, P. Gorla, P. Huff, R. Strauss, S. Pfister, S. Roth, S. Scholl, S. Sch\\\"onert, S. Wawoczny, V. Tretyak, W. Potzel, W. Seidel, X. Defay","submitted_at":"2016-04-28T16:20:56Z","abstract_excerpt":"We analyzed low-background data from the CRESST-II experiment with a total net exposure of 730 kg days to extract limits on double electron capture processes. 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