{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:1999:LK22N5IBBXXLBH5SZRUNM6MQBZ","short_pith_number":"pith:LK22N5IB","schema_version":"1.0","canonical_sha256":"5ab5a6f5010deeb09fb2cc68d679900e5fdd74330c753bd3d47daa4f69a9a824","source":{"kind":"arxiv","id":"cond-mat/9908219","version":1},"attestation_state":"computed","paper":{"title":"Towards single-electron metrology","license":"","headline":"","cross_cats":[],"primary_cat":"cond-mat.mes-hall","authors_text":"Arkadi A. Odintsov, Feike Liefrink, Karsten Flensberg, Paul Teunissen","submitted_at":"1999-08-16T10:45:15Z","abstract_excerpt":"We review the status of the understanding of single-electron transport (SET) devices with respect to their applicability in metrology. Their envisioned role as the basis of a high-precision electrical standard is outlined and is discussed in the context of other standards. The operation principles of single electron transistors, turnstiles and pumps are explained and the fundamental limits of these devices are discussed in detail. We describe the various physical mechanisms that influence the device uncertainty and review the analytical and numerical methods needed to calculate the intrinsic u"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"cond-mat/9908219","kind":"arxiv","version":1},"metadata":{"license":"","primary_cat":"cond-mat.mes-hall","submitted_at":"1999-08-16T10:45:15Z","cross_cats_sorted":[],"title_canon_sha256":"a596da33cffda174de92b1abadea50d85753b8254f45839eff46fb1eed2c6d3c","abstract_canon_sha256":"aa127b748e25cc1cbeecab3e5ccc720c1337a8bcb566c1e6fe4e70b931e44de3"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-18T01:39:28.475001Z","signature_b64":"0U3Hrx2Qe4ZjS/QApzwZkg/34niLcvKpJkfpveDmoHi/BXeNcx0d3e/FMIc06ASsR4b7ta9QIiZE/jH2PbrWDA==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"5ab5a6f5010deeb09fb2cc68d679900e5fdd74330c753bd3d47daa4f69a9a824","last_reissued_at":"2026-05-18T01:39:28.474529Z","signature_status":"signed_v1","first_computed_at":"2026-05-18T01:39:28.474529Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Towards single-electron metrology","license":"","headline":"","cross_cats":[],"primary_cat":"cond-mat.mes-hall","authors_text":"Arkadi A. Odintsov, Feike Liefrink, Karsten Flensberg, Paul Teunissen","submitted_at":"1999-08-16T10:45:15Z","abstract_excerpt":"We review the status of the understanding of single-electron transport (SET) devices with respect to their applicability in metrology. Their envisioned role as the basis of a high-precision electrical standard is outlined and is discussed in the context of other standards. The operation principles of single electron transistors, turnstiles and pumps are explained and the fundamental limits of these devices are discussed in detail. We describe the various physical mechanisms that influence the device uncertainty and review the analytical and numerical methods needed to calculate the intrinsic u"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"cond-mat/9908219","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"cond-mat/9908219","created_at":"2026-05-18T01:39:28.474606+00:00"},{"alias_kind":"arxiv_version","alias_value":"cond-mat/9908219v1","created_at":"2026-05-18T01:39:28.474606+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.cond-mat/9908219","created_at":"2026-05-18T01:39:28.474606+00:00"},{"alias_kind":"pith_short_12","alias_value":"LK22N5IBBXXL","created_at":"2026-05-18T12:25:49.631198+00:00"},{"alias_kind":"pith_short_16","alias_value":"LK22N5IBBXXLBH5S","created_at":"2026-05-18T12:25:49.631198+00:00"},{"alias_kind":"pith_short_8","alias_value":"LK22N5IB","created_at":"2026-05-18T12:25:49.631198+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/LK22N5IBBXXLBH5SZRUNM6MQBZ","json":"https://pith.science/pith/LK22N5IBBXXLBH5SZRUNM6MQBZ.json","graph_json":"https://pith.science/api/pith-number/LK22N5IBBXXLBH5SZRUNM6MQBZ/graph.json","events_json":"https://pith.science/api/pith-number/LK22N5IBBXXLBH5SZRUNM6MQBZ/events.json","paper":"https://pith.science/paper/LK22N5IB"},"agent_actions":{"view_html":"https://pith.science/pith/LK22N5IBBXXLBH5SZRUNM6MQBZ","download_json":"https://pith.science/pith/LK22N5IBBXXLBH5SZRUNM6MQBZ.json","view_paper":"https://pith.science/paper/LK22N5IB","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=cond-mat/9908219&json=true","fetch_graph":"https://pith.science/api/pith-number/LK22N5IBBXXLBH5SZRUNM6MQBZ/graph.json","fetch_events":"https://pith.science/api/pith-number/LK22N5IBBXXLBH5SZRUNM6MQBZ/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/LK22N5IBBXXLBH5SZRUNM6MQBZ/action/timestamp_anchor","attest_storage":"https://pith.science/pith/LK22N5IBBXXLBH5SZRUNM6MQBZ/action/storage_attestation","attest_author":"https://pith.science/pith/LK22N5IBBXXLBH5SZRUNM6MQBZ/action/author_attestation","sign_citation":"https://pith.science/pith/LK22N5IBBXXLBH5SZRUNM6MQBZ/action/citation_signature","submit_replication":"https://pith.science/pith/LK22N5IBBXXLBH5SZRUNM6MQBZ/action/replication_record"}},"created_at":"2026-05-18T01:39:28.474606+00:00","updated_at":"2026-05-18T01:39:28.474606+00:00"}