{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2022:NOZYIAEPONSYPVWTJ7533ZCFDX","short_pith_number":"pith:NOZYIAEP","schema_version":"1.0","canonical_sha256":"6bb384008f736587d6d34ffbbde4451df386f5780e2c713c9a333d7cade3ca02","source":{"kind":"arxiv","id":"2205.10962","version":2},"attestation_state":"computed","paper":{"title":"Digital Twin for Secure Semiconductor Lifecycle Management: Prospects and Applications","license":"http://creativecommons.org/licenses/by/4.0/","headline":"","cross_cats":[],"primary_cat":"cs.CR","authors_text":"Fahim Rahman, Farimah Farahmandi, Hasan Al Shaikh, Mark Tehranipoor, Mohammad Bin Monjil, Navid Asadizanjani, Shigang Chen","submitted_at":"2022-05-22T23:52:15Z","abstract_excerpt":"The expansive globalization of the semiconductor supply chain has introduced numerous untrusted entities into different stages of a device's lifecycle. To make matters worse, the increase complexity in the design as well as aggressive time to market requirements of the newer generation of integrated circuits can lead either designers to unintentionally introduce security vulnerabilities or verification engineers to fail in detecting them earlier in the design lifecycle. These overlooked or undetected vulnerabilities can be exploited by malicious entities in subsequent stages of the lifecycle t"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"2205.10962","kind":"arxiv","version":2},"metadata":{"license":"http://creativecommons.org/licenses/by/4.0/","primary_cat":"cs.CR","submitted_at":"2022-05-22T23:52:15Z","cross_cats_sorted":[],"title_canon_sha256":"3b8653f0c477f2954aedf63b13ff544594eb4e269af99e54b15a5627dd5be417","abstract_canon_sha256":"29abeab603445b652896b32c2a8b38736719a4157fe45aa94f26be1695662975"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-07-05T04:26:12.972386Z","signature_b64":"4SD6XoabGbsx1z3trPe2jVqdLhiWP844+pXmJaxQLhB/6MT/bF1dSHvm72s7brnKetrdrMg+OPlh7PmL6lkCDg==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"6bb384008f736587d6d34ffbbde4451df386f5780e2c713c9a333d7cade3ca02","last_reissued_at":"2026-07-05T04:26:12.971884Z","signature_status":"signed_v1","first_computed_at":"2026-07-05T04:26:12.971884Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Digital Twin for Secure Semiconductor Lifecycle Management: Prospects and Applications","license":"http://creativecommons.org/licenses/by/4.0/","headline":"","cross_cats":[],"primary_cat":"cs.CR","authors_text":"Fahim Rahman, Farimah Farahmandi, Hasan Al Shaikh, Mark Tehranipoor, Mohammad Bin Monjil, Navid Asadizanjani, Shigang Chen","submitted_at":"2022-05-22T23:52:15Z","abstract_excerpt":"The expansive globalization of the semiconductor supply chain has introduced numerous untrusted entities into different stages of a device's lifecycle. To make matters worse, the increase complexity in the design as well as aggressive time to market requirements of the newer generation of integrated circuits can lead either designers to unintentionally introduce security vulnerabilities or verification engineers to fail in detecting them earlier in the design lifecycle. These overlooked or undetected vulnerabilities can be exploited by malicious entities in subsequent stages of the lifecycle t"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"2205.10962","kind":"arxiv","version":2},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/2205.10962/integrity.json","findings":[],"available":true,"detectors_run":[],"snapshot_sha256":"c28c3603d3b5d939e8dc4c7e95fa8dfce3d595e45f758748cecf8e644a296938"},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"2205.10962","created_at":"2026-07-05T04:26:12.971935+00:00"},{"alias_kind":"arxiv_version","alias_value":"2205.10962v2","created_at":"2026-07-05T04:26:12.971935+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.2205.10962","created_at":"2026-07-05T04:26:12.971935+00:00"},{"alias_kind":"pith_short_12","alias_value":"NOZYIAEPONSY","created_at":"2026-07-05T04:26:12.971935+00:00"},{"alias_kind":"pith_short_16","alias_value":"NOZYIAEPONSYPVWT","created_at":"2026-07-05T04:26:12.971935+00:00"},{"alias_kind":"pith_short_8","alias_value":"NOZYIAEP","created_at":"2026-07-05T04:26:12.971935+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":1,"internal_anchor_count":1,"sample":[{"citing_arxiv_id":"2505.17310","citing_title":"Advancing Security with Digital Twins: A Comprehensive Survey","ref_index":18,"is_internal_anchor":true}]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/NOZYIAEPONSYPVWTJ7533ZCFDX","json":"https://pith.science/pith/NOZYIAEPONSYPVWTJ7533ZCFDX.json","graph_json":"https://pith.science/api/pith-number/NOZYIAEPONSYPVWTJ7533ZCFDX/graph.json","events_json":"https://pith.science/api/pith-number/NOZYIAEPONSYPVWTJ7533ZCFDX/events.json","paper":"https://pith.science/paper/NOZYIAEP"},"agent_actions":{"view_html":"https://pith.science/pith/NOZYIAEPONSYPVWTJ7533ZCFDX","download_json":"https://pith.science/pith/NOZYIAEPONSYPVWTJ7533ZCFDX.json","view_paper":"https://pith.science/paper/NOZYIAEP","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=2205.10962&json=true","fetch_graph":"https://pith.science/api/pith-number/NOZYIAEPONSYPVWTJ7533ZCFDX/graph.json","fetch_events":"https://pith.science/api/pith-number/NOZYIAEPONSYPVWTJ7533ZCFDX/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/NOZYIAEPONSYPVWTJ7533ZCFDX/action/timestamp_anchor","attest_storage":"https://pith.science/pith/NOZYIAEPONSYPVWTJ7533ZCFDX/action/storage_attestation","attest_author":"https://pith.science/pith/NOZYIAEPONSYPVWTJ7533ZCFDX/action/author_attestation","sign_citation":"https://pith.science/pith/NOZYIAEPONSYPVWTJ7533ZCFDX/action/citation_signature","submit_replication":"https://pith.science/pith/NOZYIAEPONSYPVWTJ7533ZCFDX/action/replication_record"}},"created_at":"2026-07-05T04:26:12.971935+00:00","updated_at":"2026-07-05T04:26:12.971935+00:00"}