{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2013:NZ3ZZYGOSWP5WRDRGUIMY4ZGV5","short_pith_number":"pith:NZ3ZZYGO","schema_version":"1.0","canonical_sha256":"6e779ce0ce959fdb44713510cc7326af4e8167be2fdabf21870a436b26260f35","source":{"kind":"arxiv","id":"1312.1478","version":1},"attestation_state":"computed","paper":{"title":"Universal fluctuations in the growth of semiconductor thin films","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cond-mat.stat-mech","authors_text":"F. D. A. Aarao Reis, R. A. L. Almeida, S. O. Ferreira, T. J. Oliveira","submitted_at":"2013-12-05T09:26:44Z","abstract_excerpt":"Scaling of surface fluctuations of polycrystalline CdTe/Si(100) films grown by hot wall epitaxy are studied. The growth exponent of surface roughness and the dynamic exponent of the auto-correlation function in the mound growth regime agree with the values of the Kardar-Parisi-Zhang (KPZ) class. The scaled distributions of heights, local roughness, and extremal heights show remarkable collapse with those of the KPZ class, giving the first experimental observation of KPZ distributions in $2+1$ dimensions. Deviations from KPZ values in the long-time estimates of dynamic and roughness exponents a"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"1312.1478","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"cond-mat.stat-mech","submitted_at":"2013-12-05T09:26:44Z","cross_cats_sorted":[],"title_canon_sha256":"abe6e9a36523b4b97faec3d24ff78c6e1aac31e90a7c9f767b59ac0a8346fc2a","abstract_canon_sha256":"f998fe59231045dc604e6bf56213142cac1f5b5ca77e9c3cfc8a763df7dcec23"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-18T03:01:02.094713Z","signature_b64":"bE0Cyn49A3OPIsxCJnl8svp/SAQ4c4QCsYKRuFZIvQpuXdzojoACLhyb4dK5L4H5UZsbtYgN1MQVAyz5GOx8DA==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"6e779ce0ce959fdb44713510cc7326af4e8167be2fdabf21870a436b26260f35","last_reissued_at":"2026-05-18T03:01:02.094012Z","signature_status":"signed_v1","first_computed_at":"2026-05-18T03:01:02.094012Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Universal fluctuations in the growth of semiconductor thin films","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cond-mat.stat-mech","authors_text":"F. D. A. Aarao Reis, R. A. L. Almeida, S. O. Ferreira, T. J. Oliveira","submitted_at":"2013-12-05T09:26:44Z","abstract_excerpt":"Scaling of surface fluctuations of polycrystalline CdTe/Si(100) films grown by hot wall epitaxy are studied. The growth exponent of surface roughness and the dynamic exponent of the auto-correlation function in the mound growth regime agree with the values of the Kardar-Parisi-Zhang (KPZ) class. The scaled distributions of heights, local roughness, and extremal heights show remarkable collapse with those of the KPZ class, giving the first experimental observation of KPZ distributions in $2+1$ dimensions. Deviations from KPZ values in the long-time estimates of dynamic and roughness exponents a"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1312.1478","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"1312.1478","created_at":"2026-05-18T03:01:02.094127+00:00"},{"alias_kind":"arxiv_version","alias_value":"1312.1478v1","created_at":"2026-05-18T03:01:02.094127+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.1312.1478","created_at":"2026-05-18T03:01:02.094127+00:00"},{"alias_kind":"pith_short_12","alias_value":"NZ3ZZYGOSWP5","created_at":"2026-05-18T12:27:54.935989+00:00"},{"alias_kind":"pith_short_16","alias_value":"NZ3ZZYGOSWP5WRDR","created_at":"2026-05-18T12:27:54.935989+00:00"},{"alias_kind":"pith_short_8","alias_value":"NZ3ZZYGO","created_at":"2026-05-18T12:27:54.935989+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/NZ3ZZYGOSWP5WRDRGUIMY4ZGV5","json":"https://pith.science/pith/NZ3ZZYGOSWP5WRDRGUIMY4ZGV5.json","graph_json":"https://pith.science/api/pith-number/NZ3ZZYGOSWP5WRDRGUIMY4ZGV5/graph.json","events_json":"https://pith.science/api/pith-number/NZ3ZZYGOSWP5WRDRGUIMY4ZGV5/events.json","paper":"https://pith.science/paper/NZ3ZZYGO"},"agent_actions":{"view_html":"https://pith.science/pith/NZ3ZZYGOSWP5WRDRGUIMY4ZGV5","download_json":"https://pith.science/pith/NZ3ZZYGOSWP5WRDRGUIMY4ZGV5.json","view_paper":"https://pith.science/paper/NZ3ZZYGO","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=1312.1478&json=true","fetch_graph":"https://pith.science/api/pith-number/NZ3ZZYGOSWP5WRDRGUIMY4ZGV5/graph.json","fetch_events":"https://pith.science/api/pith-number/NZ3ZZYGOSWP5WRDRGUIMY4ZGV5/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/NZ3ZZYGOSWP5WRDRGUIMY4ZGV5/action/timestamp_anchor","attest_storage":"https://pith.science/pith/NZ3ZZYGOSWP5WRDRGUIMY4ZGV5/action/storage_attestation","attest_author":"https://pith.science/pith/NZ3ZZYGOSWP5WRDRGUIMY4ZGV5/action/author_attestation","sign_citation":"https://pith.science/pith/NZ3ZZYGOSWP5WRDRGUIMY4ZGV5/action/citation_signature","submit_replication":"https://pith.science/pith/NZ3ZZYGOSWP5WRDRGUIMY4ZGV5/action/replication_record"}},"created_at":"2026-05-18T03:01:02.094127+00:00","updated_at":"2026-05-18T03:01:02.094127+00:00"}