{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2016:O7JTFKHYEDX2Y4I46BWDIMMFW2","short_pith_number":"pith:O7JTFKHY","schema_version":"1.0","canonical_sha256":"77d332a8f820efac711cf06c343185b6a10b22efda58886aa65fcd2222843549","source":{"kind":"arxiv","id":"1609.00236","version":1},"attestation_state":"computed","paper":{"title":"Semiconductor characterization by scanning ion beam induced charge (IBIC) microscopy","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["physics.ins-det"],"primary_cat":"cond-mat.mtrl-sci","authors_text":"A. Lo Giudice, C. Manfredotti, E. Colombo, E. Vittone, F. Fizzotti, M. Jaksic, P. Olivero, Z. Pastuovic","submitted_at":"2016-09-01T13:49:24Z","abstract_excerpt":"The acronym IBIC (Ion Beam Induced Charge) was coined in early 1990's to indicate a scanning microscopy technique which uses MeV ion beams as probes to image the basic electronic properties of semiconductor materials and devices. Since then, IBIC has become a widespread analytical technique to characterize materials for electronics or for radiation detection, as testified by more than 200 papers published so far in peer-reviewed journals. Its success stems from the valuable information IBIC can provide on charge transport phenomena occurring in finished devices, not easily obtainable by other "},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"1609.00236","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"cond-mat.mtrl-sci","submitted_at":"2016-09-01T13:49:24Z","cross_cats_sorted":["physics.ins-det"],"title_canon_sha256":"b0eab8b39719fda27ffe8e5e815f568d8aa957342893309225d38b24e9ba68d0","abstract_canon_sha256":"b9bd7b4c1930a92bff86c006469d6bae21a1e5a14d0e0798dc8e8a33a3f5add1"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-18T01:06:25.318609Z","signature_b64":"A/2HCUi9ate8fa29P4XEji+YCYcFq96T8zKh3xFuZkbAnBy11C3H9m+pa+fKmA42u2bV76h4AB81FwDCqNPvCQ==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"77d332a8f820efac711cf06c343185b6a10b22efda58886aa65fcd2222843549","last_reissued_at":"2026-05-18T01:06:25.318080Z","signature_status":"signed_v1","first_computed_at":"2026-05-18T01:06:25.318080Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Semiconductor characterization by scanning ion beam induced charge (IBIC) microscopy","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["physics.ins-det"],"primary_cat":"cond-mat.mtrl-sci","authors_text":"A. Lo Giudice, C. Manfredotti, E. Colombo, E. Vittone, F. Fizzotti, M. Jaksic, P. Olivero, Z. Pastuovic","submitted_at":"2016-09-01T13:49:24Z","abstract_excerpt":"The acronym IBIC (Ion Beam Induced Charge) was coined in early 1990's to indicate a scanning microscopy technique which uses MeV ion beams as probes to image the basic electronic properties of semiconductor materials and devices. Since then, IBIC has become a widespread analytical technique to characterize materials for electronics or for radiation detection, as testified by more than 200 papers published so far in peer-reviewed journals. Its success stems from the valuable information IBIC can provide on charge transport phenomena occurring in finished devices, not easily obtainable by other "},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1609.00236","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"1609.00236","created_at":"2026-05-18T01:06:25.318147+00:00"},{"alias_kind":"arxiv_version","alias_value":"1609.00236v1","created_at":"2026-05-18T01:06:25.318147+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.1609.00236","created_at":"2026-05-18T01:06:25.318147+00:00"},{"alias_kind":"pith_short_12","alias_value":"O7JTFKHYEDX2","created_at":"2026-05-18T12:30:36.002864+00:00"},{"alias_kind":"pith_short_16","alias_value":"O7JTFKHYEDX2Y4I4","created_at":"2026-05-18T12:30:36.002864+00:00"},{"alias_kind":"pith_short_8","alias_value":"O7JTFKHY","created_at":"2026-05-18T12:30:36.002864+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/O7JTFKHYEDX2Y4I46BWDIMMFW2","json":"https://pith.science/pith/O7JTFKHYEDX2Y4I46BWDIMMFW2.json","graph_json":"https://pith.science/api/pith-number/O7JTFKHYEDX2Y4I46BWDIMMFW2/graph.json","events_json":"https://pith.science/api/pith-number/O7JTFKHYEDX2Y4I46BWDIMMFW2/events.json","paper":"https://pith.science/paper/O7JTFKHY"},"agent_actions":{"view_html":"https://pith.science/pith/O7JTFKHYEDX2Y4I46BWDIMMFW2","download_json":"https://pith.science/pith/O7JTFKHYEDX2Y4I46BWDIMMFW2.json","view_paper":"https://pith.science/paper/O7JTFKHY","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=1609.00236&json=true","fetch_graph":"https://pith.science/api/pith-number/O7JTFKHYEDX2Y4I46BWDIMMFW2/graph.json","fetch_events":"https://pith.science/api/pith-number/O7JTFKHYEDX2Y4I46BWDIMMFW2/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/O7JTFKHYEDX2Y4I46BWDIMMFW2/action/timestamp_anchor","attest_storage":"https://pith.science/pith/O7JTFKHYEDX2Y4I46BWDIMMFW2/action/storage_attestation","attest_author":"https://pith.science/pith/O7JTFKHYEDX2Y4I46BWDIMMFW2/action/author_attestation","sign_citation":"https://pith.science/pith/O7JTFKHYEDX2Y4I46BWDIMMFW2/action/citation_signature","submit_replication":"https://pith.science/pith/O7JTFKHYEDX2Y4I46BWDIMMFW2/action/replication_record"}},"created_at":"2026-05-18T01:06:25.318147+00:00","updated_at":"2026-05-18T01:06:25.318147+00:00"}