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We show that in the low bias (Ohmic) regime, the temperature (T) dependent resistance (R) of all the devices follow Efros-Shklovskii variable range hopping (ES-VRH) R ~ exp[(T(ES)/T)^1/2] with T(ES) decreasing from 30976 to 4225 K and electron localization length increasing from 0.46 to 3.21 nm with increasing sp2 fraction. From our data, we predict that for the temperature range used in our study, Mott-VRH may not be observed eve"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"1210.1876","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"cond-mat.mes-hall","submitted_at":"2012-10-05T22:00:25Z","cross_cats_sorted":[],"title_canon_sha256":"05aa59328de22c262576950e4472ee52170ba77c28e8a0aba380628c7131a491","abstract_canon_sha256":"ccb5b4322f4164fc233b8a7ba35fe47a6c21943db6b7dfe4d13f6603f223707e"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-18T01:54:05.154439Z","signature_b64":"Exd0pJ9k9snlzvBAQUp59MOhfRKxqXV07oCfXz3zpdFedu6CcEw4siDA/00o3F6KPfDn+mcR3/IcFQnvFwRtAQ==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"79d79323d81171adebc1234605d32cdef1e971bb0778f13af6d95cbcdc4b714b","last_reissued_at":"2026-05-18T01:54:05.153997Z","signature_status":"signed_v1","first_computed_at":"2026-05-18T01:54:05.153997Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Efros-Shklovskii variable range hopping in reduced graphene oxide sheets of varying carbon sp2 fraction","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cond-mat.mes-hall","authors_text":"Daeha Joung, Saiful I. 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