{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2023:QP6KMWOTIZCMNVWDJS5L2RYNFC","short_pith_number":"pith:QP6KMWOT","schema_version":"1.0","canonical_sha256":"83fca659d34644c6d6c34cbabd470d28ac26f92518f18f549cefa40478a2f61a","source":{"kind":"arxiv","id":"2310.16275","version":1},"attestation_state":"computed","paper":{"title":"Non-Destructive Imaging of Breakdown Process in Ferroelectric Capacitors Using \\textit{In-situ} Laser-Based Photoemission Electron Microscopy","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["cond-mat.mtrl-sci"],"primary_cat":"physics.app-ph","authors_text":"C\\'edric Bareille, Hirokazu Fujiwara, Masaharu Kobayashi, Shik Shin, Toshiyuki Taniuchi, Yuki Itoya","submitted_at":"2023-10-25T01:15:46Z","abstract_excerpt":"HfO$_2$-based ferroelectrics are one of the most actively developed functional materials for memory devices. However, in HfO$_2$-based ferroelectric devices, dielectric breakdown is a main failure mechanism during repeated polarization switching. Elucidation of the breakdown process may broaden the scope of applications for the ferroelectric HfO$_2$. Here, we report direct observations of a breakdown process in HfO$_2$-based ferroelectric capacitors, by \\textit{in-situ} laser-based photoemission electron microscopy (laser-PEEM). We have not only clearly visualized the hard dielectric breakdown"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"2310.16275","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.app-ph","submitted_at":"2023-10-25T01:15:46Z","cross_cats_sorted":["cond-mat.mtrl-sci"],"title_canon_sha256":"b783d8743fbb96fb1591950f53e67cccb9e5ebcc2e86649a7f144c78f22c9e54","abstract_canon_sha256":"f1a4affbd030af650e7c4883ee42024ab71551f8be519920ec02257d29c83475"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-07-05T07:04:54.985972Z","signature_b64":"Z7QMUVrEDpoVp6Ydkh10oSR7Htz0QISAdj6/ZYaOlLY6ICtv4B2GdtgTS213Mqwlw/9fSjhhrxPjjBkqKm89BQ==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"83fca659d34644c6d6c34cbabd470d28ac26f92518f18f549cefa40478a2f61a","last_reissued_at":"2026-07-05T07:04:54.985470Z","signature_status":"signed_v1","first_computed_at":"2026-07-05T07:04:54.985470Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Non-Destructive Imaging of Breakdown Process in Ferroelectric Capacitors Using \\textit{In-situ} Laser-Based Photoemission Electron Microscopy","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["cond-mat.mtrl-sci"],"primary_cat":"physics.app-ph","authors_text":"C\\'edric Bareille, Hirokazu Fujiwara, Masaharu Kobayashi, Shik Shin, Toshiyuki Taniuchi, Yuki Itoya","submitted_at":"2023-10-25T01:15:46Z","abstract_excerpt":"HfO$_2$-based ferroelectrics are one of the most actively developed functional materials for memory devices. However, in HfO$_2$-based ferroelectric devices, dielectric breakdown is a main failure mechanism during repeated polarization switching. Elucidation of the breakdown process may broaden the scope of applications for the ferroelectric HfO$_2$. Here, we report direct observations of a breakdown process in HfO$_2$-based ferroelectric capacitors, by \\textit{in-situ} laser-based photoemission electron microscopy (laser-PEEM). We have not only clearly visualized the hard dielectric breakdown"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"2310.16275","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/2310.16275/integrity.json","findings":[],"available":true,"detectors_run":[],"snapshot_sha256":"c28c3603d3b5d939e8dc4c7e95fa8dfce3d595e45f758748cecf8e644a296938"},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"2310.16275","created_at":"2026-07-05T07:04:54.985542+00:00"},{"alias_kind":"arxiv_version","alias_value":"2310.16275v1","created_at":"2026-07-05T07:04:54.985542+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.2310.16275","created_at":"2026-07-05T07:04:54.985542+00:00"},{"alias_kind":"pith_short_12","alias_value":"QP6KMWOTIZCM","created_at":"2026-07-05T07:04:54.985542+00:00"},{"alias_kind":"pith_short_16","alias_value":"QP6KMWOTIZCMNVWD","created_at":"2026-07-05T07:04:54.985542+00:00"},{"alias_kind":"pith_short_8","alias_value":"QP6KMWOT","created_at":"2026-07-05T07:04:54.985542+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/QP6KMWOTIZCMNVWDJS5L2RYNFC","json":"https://pith.science/pith/QP6KMWOTIZCMNVWDJS5L2RYNFC.json","graph_json":"https://pith.science/api/pith-number/QP6KMWOTIZCMNVWDJS5L2RYNFC/graph.json","events_json":"https://pith.science/api/pith-number/QP6KMWOTIZCMNVWDJS5L2RYNFC/events.json","paper":"https://pith.science/paper/QP6KMWOT"},"agent_actions":{"view_html":"https://pith.science/pith/QP6KMWOTIZCMNVWDJS5L2RYNFC","download_json":"https://pith.science/pith/QP6KMWOTIZCMNVWDJS5L2RYNFC.json","view_paper":"https://pith.science/paper/QP6KMWOT","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=2310.16275&json=true","fetch_graph":"https://pith.science/api/pith-number/QP6KMWOTIZCMNVWDJS5L2RYNFC/graph.json","fetch_events":"https://pith.science/api/pith-number/QP6KMWOTIZCMNVWDJS5L2RYNFC/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/QP6KMWOTIZCMNVWDJS5L2RYNFC/action/timestamp_anchor","attest_storage":"https://pith.science/pith/QP6KMWOTIZCMNVWDJS5L2RYNFC/action/storage_attestation","attest_author":"https://pith.science/pith/QP6KMWOTIZCMNVWDJS5L2RYNFC/action/author_attestation","sign_citation":"https://pith.science/pith/QP6KMWOTIZCMNVWDJS5L2RYNFC/action/citation_signature","submit_replication":"https://pith.science/pith/QP6KMWOTIZCMNVWDJS5L2RYNFC/action/replication_record"}},"created_at":"2026-07-05T07:04:54.985542+00:00","updated_at":"2026-07-05T07:04:54.985542+00:00"}