{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2023:RIBYYN563FQEVV4OR4YT7XVJWB","short_pith_number":"pith:RIBYYN56","schema_version":"1.0","canonical_sha256":"8a038c37bed9604ad78e8f313fdea9b0674d7ed7b472832f4255386f69bc8b24","source":{"kind":"arxiv","id":"2304.01362","version":1},"attestation_state":"computed","paper":{"title":"Low-loss Si-based Dielectrics for High Frequency Components of Superconducting Detectors","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["physics.ins-det"],"primary_cat":"astro-ph.IM","authors_text":"C. L. Chang, G. Wang, J. Li, M. Lisovenko, P. S. Barry, R. Gualtieri, T. Cecil, V. Novosad, V. Yefremenko, Z. Pan","submitted_at":"2023-04-03T20:32:14Z","abstract_excerpt":"Silicon-based dielectric is crucial for many superconducting devices, including high-frequency transmission lines, filters, and resonators. Defects and contaminants in the amorphous dielectric and at the interfaces between the dielectric and metal layers can cause microwave losses and degrade device performance. Optimization of the dielectric fabrication, device structure, and surface morphology can help mitigate this problem. We present the fabrication of silicon oxide and nitride thin film dielectrics. We then characterized them using Scanning Electron Microscopy, Atomic Force Microscopy, an"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"2304.01362","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"astro-ph.IM","submitted_at":"2023-04-03T20:32:14Z","cross_cats_sorted":["physics.ins-det"],"title_canon_sha256":"7cdae61e2c96ae0fa25a2c0c77fe8efea1409a7d785f110d779f96ae7df16f8a","abstract_canon_sha256":"cdefc5e2031b7f52a348b03996249011ffe4e8d056831ca2dff7ce389de391f8"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-07-05T06:38:52.648526Z","signature_b64":"KjY9h4gvVDT0nr0pj/9U58bkDHk2vhK6GbL7olAvP4U3uRKRanjyjAtKMH+Tl4I2GXSDDB7KwOrohKZljCCuDw==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"8a038c37bed9604ad78e8f313fdea9b0674d7ed7b472832f4255386f69bc8b24","last_reissued_at":"2026-07-05T06:38:52.648040Z","signature_status":"signed_v1","first_computed_at":"2026-07-05T06:38:52.648040Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Low-loss Si-based Dielectrics for High Frequency Components of Superconducting Detectors","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["physics.ins-det"],"primary_cat":"astro-ph.IM","authors_text":"C. L. Chang, G. Wang, J. Li, M. Lisovenko, P. S. Barry, R. Gualtieri, T. Cecil, V. Novosad, V. Yefremenko, Z. Pan","submitted_at":"2023-04-03T20:32:14Z","abstract_excerpt":"Silicon-based dielectric is crucial for many superconducting devices, including high-frequency transmission lines, filters, and resonators. Defects and contaminants in the amorphous dielectric and at the interfaces between the dielectric and metal layers can cause microwave losses and degrade device performance. Optimization of the dielectric fabrication, device structure, and surface morphology can help mitigate this problem. We present the fabrication of silicon oxide and nitride thin film dielectrics. We then characterized them using Scanning Electron Microscopy, Atomic Force Microscopy, an"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"2304.01362","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/2304.01362/integrity.json","findings":[],"available":true,"detectors_run":[],"snapshot_sha256":"c28c3603d3b5d939e8dc4c7e95fa8dfce3d595e45f758748cecf8e644a296938"},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"2304.01362","created_at":"2026-07-05T06:38:52.648098+00:00"},{"alias_kind":"arxiv_version","alias_value":"2304.01362v1","created_at":"2026-07-05T06:38:52.648098+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.2304.01362","created_at":"2026-07-05T06:38:52.648098+00:00"},{"alias_kind":"pith_short_12","alias_value":"RIBYYN563FQE","created_at":"2026-07-05T06:38:52.648098+00:00"},{"alias_kind":"pith_short_16","alias_value":"RIBYYN563FQEVV4O","created_at":"2026-07-05T06:38:52.648098+00:00"},{"alias_kind":"pith_short_8","alias_value":"RIBYYN56","created_at":"2026-07-05T06:38:52.648098+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/RIBYYN563FQEVV4OR4YT7XVJWB","json":"https://pith.science/pith/RIBYYN563FQEVV4OR4YT7XVJWB.json","graph_json":"https://pith.science/api/pith-number/RIBYYN563FQEVV4OR4YT7XVJWB/graph.json","events_json":"https://pith.science/api/pith-number/RIBYYN563FQEVV4OR4YT7XVJWB/events.json","paper":"https://pith.science/paper/RIBYYN56"},"agent_actions":{"view_html":"https://pith.science/pith/RIBYYN563FQEVV4OR4YT7XVJWB","download_json":"https://pith.science/pith/RIBYYN563FQEVV4OR4YT7XVJWB.json","view_paper":"https://pith.science/paper/RIBYYN56","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=2304.01362&json=true","fetch_graph":"https://pith.science/api/pith-number/RIBYYN563FQEVV4OR4YT7XVJWB/graph.json","fetch_events":"https://pith.science/api/pith-number/RIBYYN563FQEVV4OR4YT7XVJWB/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/RIBYYN563FQEVV4OR4YT7XVJWB/action/timestamp_anchor","attest_storage":"https://pith.science/pith/RIBYYN563FQEVV4OR4YT7XVJWB/action/storage_attestation","attest_author":"https://pith.science/pith/RIBYYN563FQEVV4OR4YT7XVJWB/action/author_attestation","sign_citation":"https://pith.science/pith/RIBYYN563FQEVV4OR4YT7XVJWB/action/citation_signature","submit_replication":"https://pith.science/pith/RIBYYN563FQEVV4OR4YT7XVJWB/action/replication_record"}},"created_at":"2026-07-05T06:38:52.648098+00:00","updated_at":"2026-07-05T06:38:52.648098+00:00"}