{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2016:TXNDBNI3WIAMBY3U7OHOV5FLKV","short_pith_number":"pith:TXNDBNI3","schema_version":"1.0","canonical_sha256":"9dda30b51bb200c0e374fb8eeaf4ab556edec02d73f98394d584987b8d084177","source":{"kind":"arxiv","id":"1603.02720","version":5},"attestation_state":"computed","paper":{"title":"Multilayer optical calculations","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["physics.optics"],"primary_cat":"physics.comp-ph","authors_text":"Steven J. Byrnes","submitted_at":"2016-03-06T02:09:50Z","abstract_excerpt":"When light hits a multilayer planar stack, it is reflected, refracted, and absorbed in a way that can be derived from the Fresnel equations. The analysis is treated in many textbooks, and implemented in many software programs, but certain aspects of it are difficult to find explicitly and consistently worked out in the literature. Here, we derive the formulas underlying the transfer-matrix method of calculating the optical properties of these stacks, including oblique-angle incidence, absorption-vs-position profiles, and ellipsometry parameters. We discuss and explain some strange consequences"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"1603.02720","kind":"arxiv","version":5},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"physics.comp-ph","submitted_at":"2016-03-06T02:09:50Z","cross_cats_sorted":["physics.optics"],"title_canon_sha256":"bc37fbfae02fa156bc8b32d6f296c02b52ec73b8c7cafeb230f6ceb3e8a07b85","abstract_canon_sha256":"d8c845d6cafe159beaeb0ec5f1f822d3e0d097ae8ff0a84a5c37665f709664d2"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-07-05T02:03:13.061401Z","signature_b64":"iJ4Dy6gH+nQzr0bUUYrmCKWJhPUgNWx74JA8jnkTHMBKOlu3VD11dFekWqETep2tTidWnw01iCddH9HdJR8OBQ==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"9dda30b51bb200c0e374fb8eeaf4ab556edec02d73f98394d584987b8d084177","last_reissued_at":"2026-07-05T02:03:13.061028Z","signature_status":"signed_v1","first_computed_at":"2026-07-05T02:03:13.061028Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Multilayer optical calculations","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["physics.optics"],"primary_cat":"physics.comp-ph","authors_text":"Steven J. Byrnes","submitted_at":"2016-03-06T02:09:50Z","abstract_excerpt":"When light hits a multilayer planar stack, it is reflected, refracted, and absorbed in a way that can be derived from the Fresnel equations. The analysis is treated in many textbooks, and implemented in many software programs, but certain aspects of it are difficult to find explicitly and consistently worked out in the literature. Here, we derive the formulas underlying the transfer-matrix method of calculating the optical properties of these stacks, including oblique-angle incidence, absorption-vs-position profiles, and ellipsometry parameters. We discuss and explain some strange consequences"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1603.02720","kind":"arxiv","version":5},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/1603.02720/integrity.json","findings":[],"available":true,"detectors_run":[],"snapshot_sha256":"c28c3603d3b5d939e8dc4c7e95fa8dfce3d595e45f758748cecf8e644a296938"},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"1603.02720","created_at":"2026-07-05T02:03:13.061088+00:00"},{"alias_kind":"arxiv_version","alias_value":"1603.02720v5","created_at":"2026-07-05T02:03:13.061088+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.1603.02720","created_at":"2026-07-05T02:03:13.061088+00:00"},{"alias_kind":"pith_short_12","alias_value":"TXNDBNI3WIAM","created_at":"2026-07-05T02:03:13.061088+00:00"},{"alias_kind":"pith_short_16","alias_value":"TXNDBNI3WIAMBY3U","created_at":"2026-07-05T02:03:13.061088+00:00"},{"alias_kind":"pith_short_8","alias_value":"TXNDBNI3","created_at":"2026-07-05T02:03:13.061088+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":5,"internal_anchor_count":0,"sample":[{"citing_arxiv_id":"2606.08108","citing_title":"Machine-learning surrogate model for one-dimensional GaAs/Al$_{0.3}$Ga$_{0.7}$As distributed Bragg reflector spectra","ref_index":6,"is_internal_anchor":false},{"citing_arxiv_id":"2606.05057","citing_title":"Bulk and surface excitons in the van der Waals magnet CrSBr: Magneto-optical studies to 55 tesla","ref_index":34,"is_internal_anchor":false},{"citing_arxiv_id":"2607.00648","citing_title":"Double-pulse control of all optical magnetization reversal in Tb/Co multilayers","ref_index":2,"is_internal_anchor":false},{"citing_arxiv_id":"2305.04471","citing_title":"Gate-modulated reflectance spectroscopy for detecting excitonic species in two-dimensional semiconductors","ref_index":6,"is_internal_anchor":false},{"citing_arxiv_id":"2605.04382","citing_title":"Fundamental Limitations of Terahertz Quarter-Wave Plates Based on High-Contrast Dielectric Gratings","ref_index":62,"is_internal_anchor":false}]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/TXNDBNI3WIAMBY3U7OHOV5FLKV","json":"https://pith.science/pith/TXNDBNI3WIAMBY3U7OHOV5FLKV.json","graph_json":"https://pith.science/api/pith-number/TXNDBNI3WIAMBY3U7OHOV5FLKV/graph.json","events_json":"https://pith.science/api/pith-number/TXNDBNI3WIAMBY3U7OHOV5FLKV/events.json","paper":"https://pith.science/paper/TXNDBNI3"},"agent_actions":{"view_html":"https://pith.science/pith/TXNDBNI3WIAMBY3U7OHOV5FLKV","download_json":"https://pith.science/pith/TXNDBNI3WIAMBY3U7OHOV5FLKV.json","view_paper":"https://pith.science/paper/TXNDBNI3","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=1603.02720&json=true","fetch_graph":"https://pith.science/api/pith-number/TXNDBNI3WIAMBY3U7OHOV5FLKV/graph.json","fetch_events":"https://pith.science/api/pith-number/TXNDBNI3WIAMBY3U7OHOV5FLKV/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/TXNDBNI3WIAMBY3U7OHOV5FLKV/action/timestamp_anchor","attest_storage":"https://pith.science/pith/TXNDBNI3WIAMBY3U7OHOV5FLKV/action/storage_attestation","attest_author":"https://pith.science/pith/TXNDBNI3WIAMBY3U7OHOV5FLKV/action/author_attestation","sign_citation":"https://pith.science/pith/TXNDBNI3WIAMBY3U7OHOV5FLKV/action/citation_signature","submit_replication":"https://pith.science/pith/TXNDBNI3WIAMBY3U7OHOV5FLKV/action/replication_record"}},"created_at":"2026-07-05T02:03:13.061088+00:00","updated_at":"2026-07-05T02:03:13.061088+00:00"}