{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2025:UGD27NRC33QLFH43ZUTGSMDFHH","short_pith_number":"pith:UGD27NRC","schema_version":"1.0","canonical_sha256":"a187afb622dee0b29f9bcd2669306539c37ef501f0e3565d74fa5a1a2a63d674","source":{"kind":"arxiv","id":"2501.03343","version":1},"attestation_state":"computed","paper":{"title":"Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["cond-mat.mes-hall","physics.app-ph"],"primary_cat":"cond-mat.supr-con","authors_text":"(2) Department of Physics, Astronomy, Evan B. Golden (1), Lexington, MA, Massachusetts Institute of Technology, Neel A. Parmar (1), NY, Sergey K. Tolpygo (1) ((1) Lincoln Laboratory, Stony Brook, Stony Brook University, USA, USA), Vasili K. Semenov (2)","submitted_at":"2025-01-06T19:12:19Z","abstract_excerpt":"A variety of superconductor integrated circuits comprising six ac-powered SFQ shift registers with a total of 27078 bits and 108500 Josephson junctions (JJs) per 5 mm x 5 mm chip have been designed, fabricated, and tested to characterize flux trapping, fabrication process yield, and parameter spread. The six 4513-bit registers in the circuits have a common single-phase ac clock and individual input/output drivers enabling their parallel testing. We have investigated flux trapping in the circuits with various geometry, size, and distance between moats in two active ground planes (GPs), and cont"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"2501.03343","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"cond-mat.supr-con","submitted_at":"2025-01-06T19:12:19Z","cross_cats_sorted":["cond-mat.mes-hall","physics.app-ph"],"title_canon_sha256":"f4d920acc7c3413bbe17ea9ed0a51677e392fe138dea0cfadbf81984d8858504","abstract_canon_sha256":"da7e82d3f5cc909b5984977c27b63fabee9bd0b9f7bc5439c16e0f073ade19e1"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-07-05T09:57:53.271647Z","signature_b64":"fdcTIz2OXDxUCZgJr581+YuSHE8gEKXPWQEt/q47+gKvb2PrUAVwZQJXCNqh6S1b+v/rbYa4gFrVyfKcbcDSDw==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"a187afb622dee0b29f9bcd2669306539c37ef501f0e3565d74fa5a1a2a63d674","last_reissued_at":"2026-07-05T09:57:53.271228Z","signature_status":"signed_v1","first_computed_at":"2026-07-05T09:57:53.271228Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["cond-mat.mes-hall","physics.app-ph"],"primary_cat":"cond-mat.supr-con","authors_text":"(2) Department of Physics, Astronomy, Evan B. Golden (1), Lexington, MA, Massachusetts Institute of Technology, Neel A. Parmar (1), NY, Sergey K. Tolpygo (1) ((1) Lincoln Laboratory, Stony Brook, Stony Brook University, USA, USA), Vasili K. Semenov (2)","submitted_at":"2025-01-06T19:12:19Z","abstract_excerpt":"A variety of superconductor integrated circuits comprising six ac-powered SFQ shift registers with a total of 27078 bits and 108500 Josephson junctions (JJs) per 5 mm x 5 mm chip have been designed, fabricated, and tested to characterize flux trapping, fabrication process yield, and parameter spread. The six 4513-bit registers in the circuits have a common single-phase ac clock and individual input/output drivers enabling their parallel testing. We have investigated flux trapping in the circuits with various geometry, size, and distance between moats in two active ground planes (GPs), and cont"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"2501.03343","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/2501.03343/integrity.json","findings":[],"available":true,"detectors_run":[],"snapshot_sha256":"c28c3603d3b5d939e8dc4c7e95fa8dfce3d595e45f758748cecf8e644a296938"},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"2501.03343","created_at":"2026-07-05T09:57:53.271289+00:00"},{"alias_kind":"arxiv_version","alias_value":"2501.03343v1","created_at":"2026-07-05T09:57:53.271289+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.2501.03343","created_at":"2026-07-05T09:57:53.271289+00:00"},{"alias_kind":"pith_short_12","alias_value":"UGD27NRC33QL","created_at":"2026-07-05T09:57:53.271289+00:00"},{"alias_kind":"pith_short_16","alias_value":"UGD27NRC33QLFH43","created_at":"2026-07-05T09:57:53.271289+00:00"},{"alias_kind":"pith_short_8","alias_value":"UGD27NRC","created_at":"2026-07-05T09:57:53.271289+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/UGD27NRC33QLFH43ZUTGSMDFHH","json":"https://pith.science/pith/UGD27NRC33QLFH43ZUTGSMDFHH.json","graph_json":"https://pith.science/api/pith-number/UGD27NRC33QLFH43ZUTGSMDFHH/graph.json","events_json":"https://pith.science/api/pith-number/UGD27NRC33QLFH43ZUTGSMDFHH/events.json","paper":"https://pith.science/paper/UGD27NRC"},"agent_actions":{"view_html":"https://pith.science/pith/UGD27NRC33QLFH43ZUTGSMDFHH","download_json":"https://pith.science/pith/UGD27NRC33QLFH43ZUTGSMDFHH.json","view_paper":"https://pith.science/paper/UGD27NRC","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=2501.03343&json=true","fetch_graph":"https://pith.science/api/pith-number/UGD27NRC33QLFH43ZUTGSMDFHH/graph.json","fetch_events":"https://pith.science/api/pith-number/UGD27NRC33QLFH43ZUTGSMDFHH/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/UGD27NRC33QLFH43ZUTGSMDFHH/action/timestamp_anchor","attest_storage":"https://pith.science/pith/UGD27NRC33QLFH43ZUTGSMDFHH/action/storage_attestation","attest_author":"https://pith.science/pith/UGD27NRC33QLFH43ZUTGSMDFHH/action/author_attestation","sign_citation":"https://pith.science/pith/UGD27NRC33QLFH43ZUTGSMDFHH/action/citation_signature","submit_replication":"https://pith.science/pith/UGD27NRC33QLFH43ZUTGSMDFHH/action/replication_record"}},"created_at":"2026-07-05T09:57:53.271289+00:00","updated_at":"2026-07-05T09:57:53.271289+00:00"}