{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2019:UVQQOSFHHMYJ6M2G5NTSEVOJMI","short_pith_number":"pith:UVQQOSFH","schema_version":"1.0","canonical_sha256":"a5610748a73b309f3346eb672255c9622bb66efbcb253dccfbe2f1713d8dd8ec","source":{"kind":"arxiv","id":"1904.07564","version":2},"attestation_state":"computed","paper":{"title":"Dielectric properties of strained NiO thin films","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cond-mat.mtrl-sci","authors_text":"Alireza Kashir, Gil-Ho Lee, Hyeon-Woo Jeong, Pavlo Mikheenko, Yoon Hee Jeong","submitted_at":"2019-04-16T09:51:49Z","abstract_excerpt":"The dielectric properties of NiO thin films grown by pulsed laser deposition have been studied as a function of strain at temperature from 10 to 300 K. Above 150 K, the contribution of space-charge polarization to the dielectric permittivity of NiO films becomes dominant and the more defective films, which were grown at low temperatures show a drastical increase in the dielectric constant up to room temperature. While the atomically-ordered film, which was grown at high temperature doesn't show any considerable change in the dielectric constant in the range from 10 to 300 K. Below 100 K, the e"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"1904.07564","kind":"arxiv","version":2},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"cond-mat.mtrl-sci","submitted_at":"2019-04-16T09:51:49Z","cross_cats_sorted":[],"title_canon_sha256":"b635a8e7b28b0d9bbf9faf6d7938e4dda8a6e1cdcc1755592c4c60dbf9e081f8","abstract_canon_sha256":"c7e734a9f7094c059592979263a538581a5f2db80db902d4894878649f9f37b6"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-17T23:44:28.744813Z","signature_b64":"5PjheoloAs6Tndn7yFh/zAKO5QvDuS2x+9pxEjplrebDSA2+IHnkJwq7GvvH4C0n/hpBwHQBG/4vTPtW3RjiAw==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"a5610748a73b309f3346eb672255c9622bb66efbcb253dccfbe2f1713d8dd8ec","last_reissued_at":"2026-05-17T23:44:28.744307Z","signature_status":"signed_v1","first_computed_at":"2026-05-17T23:44:28.744307Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Dielectric properties of strained NiO thin films","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cond-mat.mtrl-sci","authors_text":"Alireza Kashir, Gil-Ho Lee, Hyeon-Woo Jeong, Pavlo Mikheenko, Yoon Hee Jeong","submitted_at":"2019-04-16T09:51:49Z","abstract_excerpt":"The dielectric properties of NiO thin films grown by pulsed laser deposition have been studied as a function of strain at temperature from 10 to 300 K. Above 150 K, the contribution of space-charge polarization to the dielectric permittivity of NiO films becomes dominant and the more defective films, which were grown at low temperatures show a drastical increase in the dielectric constant up to room temperature. While the atomically-ordered film, which was grown at high temperature doesn't show any considerable change in the dielectric constant in the range from 10 to 300 K. Below 100 K, the e"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1904.07564","kind":"arxiv","version":2},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"1904.07564","created_at":"2026-05-17T23:44:28.744392+00:00"},{"alias_kind":"arxiv_version","alias_value":"1904.07564v2","created_at":"2026-05-17T23:44:28.744392+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.1904.07564","created_at":"2026-05-17T23:44:28.744392+00:00"},{"alias_kind":"pith_short_12","alias_value":"UVQQOSFHHMYJ","created_at":"2026-05-18T12:33:30.264802+00:00"},{"alias_kind":"pith_short_16","alias_value":"UVQQOSFHHMYJ6M2G","created_at":"2026-05-18T12:33:30.264802+00:00"},{"alias_kind":"pith_short_8","alias_value":"UVQQOSFH","created_at":"2026-05-18T12:33:30.264802+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/UVQQOSFHHMYJ6M2G5NTSEVOJMI","json":"https://pith.science/pith/UVQQOSFHHMYJ6M2G5NTSEVOJMI.json","graph_json":"https://pith.science/api/pith-number/UVQQOSFHHMYJ6M2G5NTSEVOJMI/graph.json","events_json":"https://pith.science/api/pith-number/UVQQOSFHHMYJ6M2G5NTSEVOJMI/events.json","paper":"https://pith.science/paper/UVQQOSFH"},"agent_actions":{"view_html":"https://pith.science/pith/UVQQOSFHHMYJ6M2G5NTSEVOJMI","download_json":"https://pith.science/pith/UVQQOSFHHMYJ6M2G5NTSEVOJMI.json","view_paper":"https://pith.science/paper/UVQQOSFH","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=1904.07564&json=true","fetch_graph":"https://pith.science/api/pith-number/UVQQOSFHHMYJ6M2G5NTSEVOJMI/graph.json","fetch_events":"https://pith.science/api/pith-number/UVQQOSFHHMYJ6M2G5NTSEVOJMI/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/UVQQOSFHHMYJ6M2G5NTSEVOJMI/action/timestamp_anchor","attest_storage":"https://pith.science/pith/UVQQOSFHHMYJ6M2G5NTSEVOJMI/action/storage_attestation","attest_author":"https://pith.science/pith/UVQQOSFHHMYJ6M2G5NTSEVOJMI/action/author_attestation","sign_citation":"https://pith.science/pith/UVQQOSFHHMYJ6M2G5NTSEVOJMI/action/citation_signature","submit_replication":"https://pith.science/pith/UVQQOSFHHMYJ6M2G5NTSEVOJMI/action/replication_record"}},"created_at":"2026-05-17T23:44:28.744392+00:00","updated_at":"2026-05-17T23:44:28.744392+00:00"}