{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2025:WH4YAH7U67XZBIP5DQHX5AKADS","short_pith_number":"pith:WH4YAH7U","schema_version":"1.0","canonical_sha256":"b1f9801ff4f7ef90a1fd1c0f7e81401c9b7e6237981a2f93429d6bb6d014a1e9","source":{"kind":"arxiv","id":"2508.00193","version":1},"attestation_state":"computed","paper":{"title":"A Practical Finite Element Approach for Simulating Dynamic Crack Growth in Cu/Ultra Low-k Interconnect Structures","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["cs.SY","eess.SY"],"primary_cat":"cs.CE","authors_text":"Ethan J. Wu, Jimmy Perez, Lu Xu, Shaofan Li, Yuxi Xie","submitted_at":"2025-07-31T22:24:04Z","abstract_excerpt":"This work presents a practical finite element modeling strategy, the Crack Element Method (CEM), for simulating the dynamic crack propagation in two-dimensional structures. The method employs an element-splitting algorithm based on the Edge-based Smoothed Finite Element Method (ES-FEM) to capture the element-wise crack growth while reducing the formation of poorly shaped elements that can compromise numerical accuracy and computational performance. A fracture energy release rate formulation is also developed based on the evolving topology of the split elements. The proposed approach is validat"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"2508.00193","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"cs.CE","submitted_at":"2025-07-31T22:24:04Z","cross_cats_sorted":["cs.SY","eess.SY"],"title_canon_sha256":"a5e98b634ff11e6c12729c767c01516c89d7cc866bfde1ec9b01d547c05740d5","abstract_canon_sha256":"6b5c4095600b1a951f65fd8d3eac76aeb42170b090df68640a491a3cf7da3559"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-07-05T11:46:50.908169Z","signature_b64":"3mnuQTAstN3ORepTOiDwCE+OQdNZrQDoCnSGZhhd4ZSbugckwX1i0Mx9rUu3w0uDZdAgkNzDHdDcEToOmv6KCw==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"b1f9801ff4f7ef90a1fd1c0f7e81401c9b7e6237981a2f93429d6bb6d014a1e9","last_reissued_at":"2026-07-05T11:46:50.907686Z","signature_status":"signed_v1","first_computed_at":"2026-07-05T11:46:50.907686Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"A Practical Finite Element Approach for Simulating Dynamic Crack Growth in Cu/Ultra Low-k Interconnect Structures","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["cs.SY","eess.SY"],"primary_cat":"cs.CE","authors_text":"Ethan J. Wu, Jimmy Perez, Lu Xu, Shaofan Li, Yuxi Xie","submitted_at":"2025-07-31T22:24:04Z","abstract_excerpt":"This work presents a practical finite element modeling strategy, the Crack Element Method (CEM), for simulating the dynamic crack propagation in two-dimensional structures. The method employs an element-splitting algorithm based on the Edge-based Smoothed Finite Element Method (ES-FEM) to capture the element-wise crack growth while reducing the formation of poorly shaped elements that can compromise numerical accuracy and computational performance. A fracture energy release rate formulation is also developed based on the evolving topology of the split elements. The proposed approach is validat"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"2508.00193","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/2508.00193/integrity.json","findings":[],"available":true,"detectors_run":[],"snapshot_sha256":"c28c3603d3b5d939e8dc4c7e95fa8dfce3d595e45f758748cecf8e644a296938"},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"2508.00193","created_at":"2026-07-05T11:46:50.907746+00:00"},{"alias_kind":"arxiv_version","alias_value":"2508.00193v1","created_at":"2026-07-05T11:46:50.907746+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.2508.00193","created_at":"2026-07-05T11:46:50.907746+00:00"},{"alias_kind":"pith_short_12","alias_value":"WH4YAH7U67XZ","created_at":"2026-07-05T11:46:50.907746+00:00"},{"alias_kind":"pith_short_16","alias_value":"WH4YAH7U67XZBIP5","created_at":"2026-07-05T11:46:50.907746+00:00"},{"alias_kind":"pith_short_8","alias_value":"WH4YAH7U","created_at":"2026-07-05T11:46:50.907746+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":1,"internal_anchor_count":1,"sample":[{"citing_arxiv_id":"2509.01827","citing_title":"Revisit of Two-dimensional CEM on Crack Branching: from Single Crack-tip Tracking to Multiple Crack-tips Tracking","ref_index":41,"is_internal_anchor":true}]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/WH4YAH7U67XZBIP5DQHX5AKADS","json":"https://pith.science/pith/WH4YAH7U67XZBIP5DQHX5AKADS.json","graph_json":"https://pith.science/api/pith-number/WH4YAH7U67XZBIP5DQHX5AKADS/graph.json","events_json":"https://pith.science/api/pith-number/WH4YAH7U67XZBIP5DQHX5AKADS/events.json","paper":"https://pith.science/paper/WH4YAH7U"},"agent_actions":{"view_html":"https://pith.science/pith/WH4YAH7U67XZBIP5DQHX5AKADS","download_json":"https://pith.science/pith/WH4YAH7U67XZBIP5DQHX5AKADS.json","view_paper":"https://pith.science/paper/WH4YAH7U","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=2508.00193&json=true","fetch_graph":"https://pith.science/api/pith-number/WH4YAH7U67XZBIP5DQHX5AKADS/graph.json","fetch_events":"https://pith.science/api/pith-number/WH4YAH7U67XZBIP5DQHX5AKADS/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/WH4YAH7U67XZBIP5DQHX5AKADS/action/timestamp_anchor","attest_storage":"https://pith.science/pith/WH4YAH7U67XZBIP5DQHX5AKADS/action/storage_attestation","attest_author":"https://pith.science/pith/WH4YAH7U67XZBIP5DQHX5AKADS/action/author_attestation","sign_citation":"https://pith.science/pith/WH4YAH7U67XZBIP5DQHX5AKADS/action/citation_signature","submit_replication":"https://pith.science/pith/WH4YAH7U67XZBIP5DQHX5AKADS/action/replication_record"}},"created_at":"2026-07-05T11:46:50.907746+00:00","updated_at":"2026-07-05T11:46:50.907746+00:00"}