{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2013:ZF6XAW2SZYGZJNW7KK74HHUEPH","short_pith_number":"pith:ZF6XAW2S","schema_version":"1.0","canonical_sha256":"c97d705b52ce0d94b6df52bfc39e8479e1b08c46120567517f1d43ca7c5b1f3c","source":{"kind":"arxiv","id":"1302.5074","version":2},"attestation_state":"computed","paper":{"title":"Pulsed laser deposition with simultaneous in situ real-time monitoring of optical spectroscopic ellipsometry and reflection high-energy electron diffraction","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["cond-mat.mes-hall","cond-mat.str-el","cond-mat.supr-con"],"primary_cat":"cond-mat.mtrl-sci","authors_text":"J. H. Gruenewald, J. Nichols, S. S. A. Seo","submitted_at":"2013-02-20T19:05:20Z","abstract_excerpt":"We present a pulsed laser deposition (PLD) system that can monitor growth by simultaneously using in situ optical spectroscopic ellipsometry (SE) and reflection high-energy electron diffraction (RHEED). The RHEED precisely monitors the number of thin-film layers and surface structure during the deposition and the SE measures the optical spectra of the samples simultaneously. The thin-film thickness information obtained from RHEED facilitates the SE modeling process, which allows extracting the in situ optical spectra, i.e. the dielectric functions, of thin-films during growth. The in situ diel"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"1302.5074","kind":"arxiv","version":2},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"cond-mat.mtrl-sci","submitted_at":"2013-02-20T19:05:20Z","cross_cats_sorted":["cond-mat.mes-hall","cond-mat.str-el","cond-mat.supr-con"],"title_canon_sha256":"f7efc6f4a6a3c2b02fdcc6ad0ea49d6d9e99cf742a56292f9c47a3d75c920596","abstract_canon_sha256":"cfe857a756c552788a1d2b9954f6d7913e6230a323a0b610572dd5b46bdfa4ea"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-18T03:14:06.860763Z","signature_b64":"S4i4dmqQDfwyAerKRgk4ofb2iyPZqnsaEe/07Dcw1Jg4kSjIcW1kbR9peYp+kerHA0rdk2kMHb1I0Ihm2q9DBA==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"c97d705b52ce0d94b6df52bfc39e8479e1b08c46120567517f1d43ca7c5b1f3c","last_reissued_at":"2026-05-18T03:14:06.860273Z","signature_status":"signed_v1","first_computed_at":"2026-05-18T03:14:06.860273Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Pulsed laser deposition with simultaneous in situ real-time monitoring of optical spectroscopic ellipsometry and reflection high-energy electron diffraction","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["cond-mat.mes-hall","cond-mat.str-el","cond-mat.supr-con"],"primary_cat":"cond-mat.mtrl-sci","authors_text":"J. H. Gruenewald, J. Nichols, S. S. A. Seo","submitted_at":"2013-02-20T19:05:20Z","abstract_excerpt":"We present a pulsed laser deposition (PLD) system that can monitor growth by simultaneously using in situ optical spectroscopic ellipsometry (SE) and reflection high-energy electron diffraction (RHEED). The RHEED precisely monitors the number of thin-film layers and surface structure during the deposition and the SE measures the optical spectra of the samples simultaneously. The thin-film thickness information obtained from RHEED facilitates the SE modeling process, which allows extracting the in situ optical spectra, i.e. the dielectric functions, of thin-films during growth. The in situ diel"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1302.5074","kind":"arxiv","version":2},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"1302.5074","created_at":"2026-05-18T03:14:06.860357+00:00"},{"alias_kind":"arxiv_version","alias_value":"1302.5074v2","created_at":"2026-05-18T03:14:06.860357+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.1302.5074","created_at":"2026-05-18T03:14:06.860357+00:00"},{"alias_kind":"pith_short_12","alias_value":"ZF6XAW2SZYGZ","created_at":"2026-05-18T12:28:09.283467+00:00"},{"alias_kind":"pith_short_16","alias_value":"ZF6XAW2SZYGZJNW7","created_at":"2026-05-18T12:28:09.283467+00:00"},{"alias_kind":"pith_short_8","alias_value":"ZF6XAW2S","created_at":"2026-05-18T12:28:09.283467+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/ZF6XAW2SZYGZJNW7KK74HHUEPH","json":"https://pith.science/pith/ZF6XAW2SZYGZJNW7KK74HHUEPH.json","graph_json":"https://pith.science/api/pith-number/ZF6XAW2SZYGZJNW7KK74HHUEPH/graph.json","events_json":"https://pith.science/api/pith-number/ZF6XAW2SZYGZJNW7KK74HHUEPH/events.json","paper":"https://pith.science/paper/ZF6XAW2S"},"agent_actions":{"view_html":"https://pith.science/pith/ZF6XAW2SZYGZJNW7KK74HHUEPH","download_json":"https://pith.science/pith/ZF6XAW2SZYGZJNW7KK74HHUEPH.json","view_paper":"https://pith.science/paper/ZF6XAW2S","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=1302.5074&json=true","fetch_graph":"https://pith.science/api/pith-number/ZF6XAW2SZYGZJNW7KK74HHUEPH/graph.json","fetch_events":"https://pith.science/api/pith-number/ZF6XAW2SZYGZJNW7KK74HHUEPH/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/ZF6XAW2SZYGZJNW7KK74HHUEPH/action/timestamp_anchor","attest_storage":"https://pith.science/pith/ZF6XAW2SZYGZJNW7KK74HHUEPH/action/storage_attestation","attest_author":"https://pith.science/pith/ZF6XAW2SZYGZJNW7KK74HHUEPH/action/author_attestation","sign_citation":"https://pith.science/pith/ZF6XAW2SZYGZJNW7KK74HHUEPH/action/citation_signature","submit_replication":"https://pith.science/pith/ZF6XAW2SZYGZJNW7KK74HHUEPH/action/replication_record"}},"created_at":"2026-05-18T03:14:06.860357+00:00","updated_at":"2026-05-18T03:14:06.860357+00:00"}