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M. L. Ridder

Identifiers

  • name variant M. L. Ridder 0.60 · backfill

Papers (1)

  1. Analysis of impedance and noise data of an X-ray transition-edge sensor using complex thermal models cond-mat.supr-con · 2011 · author #3

Mentions

  • 1112.0400 #3 · backfill · confidence 0.70 M. L. Ridder

Frequent Coauthors