Hyeon-Kyun Noh

Identifiers

• name variant Hyeon-Kyun Noh 0.60 · backfill

Papers (1)

1. O-vacancy as the origin of negative bias illumination stress instability in amorphous In-Ga-Zn-O thin film transistors cond-mat.mtrl-sci · 2010 · author #2

Mentions

• 1006.4913 #2 · backfill · confidence 0.70 Hyeon-Kyun Noh

Frequent Coauthors

• Byungki Ryu 1 shared papers
• Eun-Ae Choi 1 shared papers
• K. J. Chang 1 shared papers