M. Smalley
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Papers (1)
- In-Line-Test of Variability and Bit-Error-Rate of HfOx-Based Resistive Memory cs.ET · 2015 · author #12
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Frequent Coauthors
- B. L. Ji 1 shared papers
- C. Johnson 1 shared papers
- D. Veksler 1 shared papers
- H. Chong 1 shared papers
- H. Li 1 shared papers
- H. Stamper 1 shared papers
- J. Piccirillo 1 shared papers
- M. Liehr 1 shared papers
- M. Passaro 1 shared papers
- M. Rodgers 1 shared papers
- Q. Ye 1 shared papers
- S. Bennett 1 shared papers
- S. Deora 1 shared papers
- S. Gausepohl 1 shared papers
- S. Vivekanand 1 shared papers
- T. Burroughs 1 shared papers
- V. Kaushik 1 shared papers