S.J. Whiteley

Identifiers

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Papers (1)

1. Electrometry by optical charge conversion of deep defects in 4H-SiC cond-mat.mes-hall · 2018 · author #2

Mentions

No mention provenance yet.

Frequent Coauthors

• D.D. Awschalom 1 shared papers
• G. Wolfowicz 1 shared papers