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David Wallis

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Papers (3)

  1. Characterizing Dislocation Substructures in Creep-Deformed Olivine Using Electron Channeling Contrast Imaging cond-mat.mtrl-sci · 2026 · author #3
  2. Thick adherent diamond films on AlN with low thermal barrier resistance physics.app-ph · 2019 · author #7
  3. High-angular resolution electron backscatter diffraction as a new tool for mapping lattice distortion in geological minerals cond-mat.mtrl-sci · 2019 · author #1

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