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Martin Hoeferkamp

Identifiers

  • name variant Martin Hoeferkamp 0.60 · backfill

Papers (4)

  1. Effect of Temperature and Charged Particle Fluence on the Resistivity of Polycrystalline CVD Diamond Sensors physics.ins-det · 2013 · author #2
  2. A Method for Real Time Monitoring of Charged Particle Beam Profile and Fluence physics.ins-det · 2013 · author #2
  3. ATLAS Pixel Radiation Monitoring with HVPP4 System physics.ins-det · 2009 · author #2
  4. Capacitance of Silicon Pixels hep-ex · 2000 · author #2

Mentions

  • 1310.2620 #2 · backfill · confidence 0.70 Martin Hoeferkamp
  • 1310.0047 #2 · backfill · confidence 0.70 Martin Hoeferkamp
  • 0911.0128 #2 · backfill · confidence 0.70 Martin Hoeferkamp

Frequent Coauthors