A. Rar

Identifiers

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Papers (1)

1. Quantitative Comparison between AES and SIMS Depth Profiles of a Double Layer Structure of AlAs in GaAs Using the MRI-model cond-mat.mtrl-sci · 2001 · author #2

Mentions

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Frequent Coauthors

• D. W. Moon 1 shared papers
• K. Yoshihara 1 shared papers
• S. Hofmann 1 shared papers