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David J. Meyer

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Papers (3)

  1. Polarization-mediated Debye-screening of surface potential fluctuations in dual-channel AlN/GaN high electron mobility transistors cond-mat.mes-hall · 2016 · author #6
  2. Temperature and Electric Field Induced Metal-Insulator Transition in Atomic Layer Deposited Vanadium Dioxide Thin Films cond-mat.str-el · 2016 · author #5
  3. Suppression of Surface-Originated Gate-Lag by a Dual-Channel AlN/GaN HEMT Architecture cond-mat.mes-hall · 2015 · author #5

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