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Jiann Shiun Yuan

Identifiers

  • name variant Jiann Shiun Yuan 0.60 · backfill

Papers (1)

  1. From Full Boards to Tiny Defects: Scale-Aware Tile Inference with Topology-Aware Merging for High-Resolution PCB Defect Detection cs.CV · 2026 · author #4

Mentions

  • 2605.24726 #4 · arxiv_oai · confidence 0.70 Jiann Shiun Yuan

Frequent Coauthors