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F. Nepveu

Identifiers

  • name variant F. Nepveu 0.60 · backfill

Papers (1)

  1. Temperature measurement of sub-micrometric ICs by scanning thermal microscopy physics.class-ph · 2007 · author #3

Mentions

  • 0711.4530 #3 · backfill · confidence 0.70 F. Nepveu

Frequent Coauthors