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Vladimir Kaganer

Identifiers

  • name variant Vladimir Kaganer 0.60 · backfill

Papers (4)

  1. X-ray diffraction from strongly bent crystals and spectroscopy of XFEL pulses physics.ins-det · 2019 · author #1
  2. Bunches of misfit dislocations on the onset of relaxation of Si$_{0.4}$Ge$_{0.6}$/Si(001) epitaxial films revealed by high-resolution x-ray diffraction cond-mat.mtrl-sci · 2017 · author #1
  3. Influence of strain relaxation in axial (In,Ga)N/GaN nanowire heterostructures on their electronic properties cond-mat.mes-hall · 2016 · author #3
  4. In situ x-ray diffraction study of epitaxial growth of ordered Fe3Si films cond-mat.mtrl-sci · 2007 · author #2

Mentions

  • 0712.2180 #2 · backfill · confidence 0.70 Vladimir Kaganer

Frequent Coauthors