C.E. Tripa

Identifiers

• name variant C.E. Tripa 0.60 · backfill

Papers (2)

1. Measuring roughness of buried interfaces by sputter depth profiling cond-mat.mtrl-sci · 2012 · author #4
2. High resolution SIMS depth profiling of nanolayers cond-mat.mtrl-sci · 2012 · author #3

Mentions

• 1205.4045 #4 · backfill · confidence 0.70 C.E. Tripa
• 1204.6252 #3 · backfill · confidence 0.70 C.E. Tripa

Frequent Coauthors

• A.V. Zinovev 2 shared papers
• I.V. Veryovkin 2 shared papers
• J.W. Elam 2 shared papers
• S.V. Baryshev 2 shared papers
• J.A. Klug 1 shared papers
• M.J. Pellin 1 shared papers
• Q. Peng 1 shared papers