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Tetsuo Hatakeyama

Identifiers

  • name variant Tetsuo Hatakeyama 0.60 · backfill

Papers (1)

  1. Characterization of Interface Traps in SiO$_2$/SiC Structures Close to the Conduction Band by Deep-Level Transient Spectroscopy cond-mat.mtrl-sci · 2014 · author #1

Mentions

  • 1409.7170 #1 · backfill · confidence 0.70 Tetsuo Hatakeyama

Frequent Coauthors