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A. Csik

Identifiers

  • name variant A. Csik 0.60 · backfill

Papers (25)

  1. Magnetic and Superconducting Phase Diagram of Nb/Gd/Nb trilayers cond-mat.supr-con · 2018 · author #6
  2. Thermally activated processes of the phase composition and structure formation of the nanoscaled Co-Sb films cond-mat.mtrl-sci · 2017 · author #5
  3. Quantitative depth profiling of Si1-xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry cond-mat.mtrl-sci · 2017 · author #3
  4. Preliminary studies of creation of gold nanoparticles on titanium surface towards biomedical applications cond-mat.mtrl-sci · 2017 · author #7
  5. Morphology of PbTe crystal surface sputtered by argon plasma under Secondary Neutral Mass Spectrometry conditions cond-mat.mtrl-sci · 2017 · author #3
  6. Oscillations and huge preferences of PbTe crystal surface sputtering under Secondary Neutral Mass Spectrometry conditions cond-mat.mtrl-sci · 2017 · author #4
  7. Formation of Cu6Sn5 phase by cold homogenization in nanocrystalline Cu-Sn bilayers at room temperature cond-mat.mtrl-sci · 2017 · author #6
  8. Nanoscale characterization of thin immersion silver coatings on copper substrates cond-mat.mtrl-sci · 2015 · author #2
  9. Ion beam effect on Ge-Se chalcogenide glass films: Non-volatile memory array formation, structural changes and device performance cond-mat.mtrl-sci · 2015 · author #7
  10. Light-induced mass transport in amorphous chalcogenides: Towards surface plasmon-assisted nanolithography and near-field nanoimaging cond-mat.mtrl-sci · 2015 · author #4
  11. X-ray and neutron reflectometry study of copper surface reconstruction caused by implantation of high-energy oxygen ions cond-mat.mtrl-sci · 2014 · author #5
  12. Structural, magnetic and superconducting characterization of the CuNi/Nb bilayers of the S/F type using Polarized Neutron Reflectometry and complementary techniques cond-mat.str-el · 2014 · author #7
  13. Segregation of the Eu impurity as function of its concentration in the melt for growing of the lead telluride doped crystals by the Bridgman method cond-mat.mtrl-sci · 2014 · author #6
  14. On the feasibility to study inverse proximity effect in a single S/F bilayer by Polarized Neutron Reflectometry cond-mat.str-el · 2013 · author #10
  15. Transition from anomalous kinetics towards Fickian diffusion for Si dissolution into amorphous Ge cond-mat.mtrl-sci · 2009 · author #5
  16. Degradation of Ag/Si multilayers during heat treatments cond-mat.mtrl-sci · 2009 · author #6
  17. Laser-induced optical changes in amorphous multilayers cond-mat.mtrl-sci · 2009 · author #3
  18. Pattern formation in SiSb system cond-mat.mtrl-sci · 2009 · author #1
  19. Investigation of Sb diffusion in amorphous silicon cond-mat.mtrl-sci · 2009 · author #1
  20. Structural modifications induced in hydrogenated amorphous Si/Ge multilayers by heat treatments cond-mat.mtrl-sci · 2009 · author #3
  21. AFM and TEM study of hydrogenated sputtered Si/Ge multilayers cond-mat.mtrl-sci · 2009 · author #4
  22. Investigation of thermal stability of hydrogenated amorphous Si/Ge multilayers cond-mat.mtrl-sci · 2009 · author #1
  23. Application of Secondary Neutral Mass Spectrometry in the investigation of doped perovskites cond-mat.mtrl-sci · 2009 · author #3
  24. Reverse depth profiling of electrodeposited Co/Cu multilayers by SNMS cond-mat.mtrl-sci · 2009 · author #1
  25. Study of proximity effects in superconductor/ferromagnet interface using waveguide enhancement of neutron standing waves cond-mat.supr-con · 2009 · author #14

Mentions

  • 1401.2801 #6 · backfill · confidence 0.70 A. Csik
  • 1306.2173 #10 · backfill · confidence 0.70 A. Csik
  • 0902.2046 #5 · backfill · confidence 0.70 A. Csik
  • 0902.2045 #6 · backfill · confidence 0.70 A. Csik
  • 0902.2044 #3 · backfill · confidence 0.70 A. Csik
  • 0902.2043 #1 · backfill · confidence 0.70 A. Csik
  • 0902.2042 #1 · backfill · confidence 0.70 A. Csik
  • 0902.1814 #3 · backfill · confidence 0.70 A. Csik
  • 0902.1679 #4 · backfill · confidence 0.70 A. Csik
  • 0902.1674 #1 · backfill · confidence 0.70 A. Csik
  • 0902.1672 #1 · backfill · confidence 0.70 A. Csik
  • 0902.1649 #3 · backfill · confidence 0.70 A. Csik
  • 0901.2550 #14 · backfill · confidence 0.70 A. Csik

Frequent Coauthors