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Liang Z. Tan

Identifiers

  • name variant Liang Z. Tan 0.60 · backfill

Papers (14)

  1. Radiative electronic bound states in the continuum from defects in semiconductors cond-mat.mtrl-sci · 2026 · author #2
  2. Non-magnetic insulating phase induced by Jahn-Teller effect in RNiO$_3$ cond-mat.str-el · 2026 · author #2
  3. How Lattice and Charge Fluctuations Control Carrier Dynamics in Halide Perovskites cond-mat.mtrl-sci · 2018 · author #2
  4. Anion Exchange in II-VI Semiconducting Nanostructures via Atomic Templating cond-mat.mtrl-sci · 2017 · author #4
  5. Spin-orbit enhanced carrier lifetimes in noncentrosymmetric semiconductors cond-mat.mtrl-sci · 2017 · author #1
  6. Hybrid functional pseudopotentials physics.chem-ph · 2017 · author #2
  7. Local polar fluctuations in lead halide perovskite crystals cond-mat.mtrl-sci · 2016 · author #3
  8. Strain Induced Ferroelectric Topological Insulator cond-mat.mtrl-sci · 2015 · author #3
  9. Enhancement of bulk photovoltaic effect in topological insulators cond-mat.mes-hall · 2015 · author #1
  10. SU(4) symmetry breaking revealed by magneto-optical spectroscopy in epitaxial graphene cond-mat.str-el · 2015 · author #1
  11. Rashba Spin-Orbit Coupling Enhanced Carrier Lifetime in Organometal Halide Perovskites cond-mat.mtrl-sci · 2015 · author #2
  12. Theory of the Raman spectrum of rotated double-layer graphene cond-mat.mes-hall · 2013 · author #2
  13. Resonant Excitation of Graphene K-Phonon and Intra-Landau-Level Excitons in Magneto-Optical Spectroscopy cond-mat.mes-hall · 2012 · author #2
  14. Raman spectroscopy study of rotated double-layer graphene: Misorientation-angle dependence of electronic structure cond-mat.mes-hall · 2012 · author #3

Mentions

  • 1506.06680 #1 · backfill · confidence 0.70 Liang Z. Tan
  • 1505.04212 #2 · backfill · confidence 0.70 Liang Z. Tan
  • 2605.26841 #2 · arxiv_oai · confidence 0.70 Liang Z. Tan
  • 1304.5002 #2 · backfill · confidence 0.70 Liang Z. Tan
  • 1206.3205 #2 · backfill · confidence 0.70 Liang Z. Tan
  • 1201.4221 #3 · backfill · confidence 0.70 Liang Z. Tan

Frequent Coauthors