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Z. Pastuovic

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Papers (5)

  1. Semiconductor characterization by scanning ion beam induced charge (IBIC) microscopy cond-mat.mtrl-sci · 2016 · author #2
  2. Monte Carlo analysis of a lateral IBIC experiment on a 4H-SiC Schottky diode physics.ins-det · 2016 · author #7
  3. Direct fabrication of three-dimensional buried conductive channels in single crystal diamond with ion microbeam induced graphitization cond-mat.mtrl-sci · 2016 · author #9
  4. Charge collection efficiency mapping of interdigitated 4H-SiC detectors physics.ins-det · 2016 · author #3
  5. Focused ion beam fabrication and IBIC characterization of a diamond detector with buried electrodes physics.ins-det · 2016 · author #4

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