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S. Eyhusen

Identifiers

  • name variant S. Eyhusen 0.60 · backfill

Papers (1)

  1. An accurate measurement of electron beam induced displacement cross sections for single-layer graphene cond-mat.mtrl-sci · 2012 · author #9

Mentions

  • 1203.2372 #9 · backfill · confidence 0.70 S. Eyhusen

Frequent Coauthors