F. Fantini

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Papers (1)

1. A Biased Resistor Network Model for Electromigration Failure and Related Phenomena in Metallic Lines cond-mat.stat-mech · 2004 · author #4

Mentions

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Frequent Coauthors

• A. Scorzoni 1 shared papers
• C. Pennetta 1 shared papers
• E. Alfinito 1 shared papers
• I. DeMunari 1 shared papers
• L. Reggiani 1 shared papers