Jonathan R. Carter

Identifiers

• name variant Jonathan R. Carter 0.60 · backfill

Papers (1)

1. Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown cs.AR · 2007 · author #1

Mentions

• 0710.4715 #1 · backfill · confidence 0.70 Jonathan R. Carter

Frequent Coauthors

• Daniel J. Sorin 1 shared papers
• Sule Ozev 1 shared papers