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M. E. Reeves

Identifiers

  • name variant M. E. Reeves 0.60 · backfill

Papers (2)

  1. Parameter-free extraction of Thin-Film Dielectric Constants from Scanning Near Field Microwave Microscope Measurements cond-mat.mtrl-sci · 2009 · author #3
  2. Simultaneously imaging of dielectric properties and topography in a PbTiO_3 crystal by near-field scanning microwave microscopy cond-mat.mtrl-sci · 2000 · author #2

Mentions

  • 0909.3579 #3 · backfill · confidence 0.70 M. E. Reeves

Frequent Coauthors