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Anders Hall\'en

Identifiers

  • name variant Anders Hall\'en 0.60 · backfill

Papers (1)

  1. Ultra-thin film and interface analysis of high-k dielectric materials employing Time-Of-Flight Medium Energy Ion Scattering (TOF-MEIS) cond-mat.mtrl-sci · 2013 · author #3

Mentions

  • 1309.0611 #3 · backfill · confidence 0.70 Anders Hall\'en

Frequent Coauthors