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A.P. Marques

Identifiers

  • name variant A.P. Marques 0.60 · backfill

Papers (10)

  1. Radon-induced backgrounds in the NEXT-100 experiment hep-ex · 2026 · author #59
  2. Electroluminescence Yield Measurements in Xenon Gas with the NEXT-DEMO++ Detector physics.ins-det · 2026 · author #70
  3. High Voltage Delivery and Distribution for the NEXT-100 Time Projection Chamber physics.ins-det · 2025 · author #66
  4. Reconstructing neutrinoless double beta decay event kinematics in a xenon gas detector with vertex tagging hep-ex · 2025 · author #64
  5. Measurement of Energy Resolution with the NEXT-White Silicon Photomultipliers hep-ex · 2024 · author #64
  6. Fluorescence Imaging of Individual Ions and Molecules in Pressurized Noble Gases for Barium Tagging in $^{136}$Xe physics.ins-det · 2024 · author #68
  7. Design, characterization and installation of the NEXT-100 cathode and electroluminescence regions physics.ins-det · 2023 · author #65
  8. Demonstration of neutrinoless double beta decay searches in gaseous xenon with NEXT nucl-ex · 2023 · author #71
  9. NEXT-CRAB-0: A High Pressure Gaseous Xenon Time Projection Chamber with a Direct VUV Camera Based Readout physics.ins-det · 2023 · author #77
  10. Reflectance and fluorescence characteristics of PTFE coated with TPB at visible, UV, and VUV as a function of thickness physics.ins-det · 2022 · author #67

Mentions

  • 2502.10198 #64 · arxiv_oai · confidence 0.70 A.P. Marques
  • 2405.20427 #64 · arxiv_oai · confidence 0.70 A.P. Marques
  • 2406.15422 #68 · arxiv_oai · confidence 0.70 A.P. Marques
  • 2311.03528 #65 · arxiv_oai · confidence 0.70 A.P. Marques
  • 2305.09435 #71 · arxiv_oai · confidence 0.70 A.P. Marques
  • 2304.06091 #77 · arxiv_oai · confidence 0.70 A.P. Marques
  • 2211.05024 #67 · arxiv_oai · confidence 0.70 A.P. Marques
  • 2505.01002 #66 · arxiv_oai · confidence 0.70 A.P. Marques
  • 2604.19616 #59 · arxiv_oai · confidence 0.70 A.P. Marques

Frequent Coauthors