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Ben Carmichael

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Papers (2)

  1. Quantification of Probe-Sample Electrostatic Forces with Dynamic Atomic Force Microscopy cond-mat.mes-hall · 2016 · author #3
  2. Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy cond-mat.mtrl-sci · 2016 · author #4

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