David R. Reid
Identifiers
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Papers (1)
- An X-Band Waveguide Measurement Technique for the Accurate Characterization of Materials with Low Dielectric Loss Permittivity physics.ins-det · 2016 · author #3
Mentions
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Frequent Coauthors
- Andrew P. Morris 1 shared papers
- Jeffrey A. Bean 1 shared papers
- Jeramy M. Marsh 1 shared papers
- Jeremy D. Ellis 1 shared papers
- Kenneth W. Allen 1 shared papers
- Mark M. Scott 1 shared papers