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Sangeneni Mohan

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Papers (2)

  1. Probing defect states in few-layer MoS$_{2}$ by conductance fluctuation spectroscopy cond-mat.mes-hall · 2019 · author #3
  2. Dielectric Engineering of HfO2 Gate Stacks Towards Normally-ON and Normally-OFF GaN HEMTs on Silicon cond-mat.mtrl-sci · 2017 · author #9

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