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Jean-Yves Veuillen

Identifiers

  • name variant Jean-Yves Veuillen 0.60 · backfill

Papers (2)

  1. Weakly Trapped, Charged, and Free Excitons in Single-Layer MoS2 in the Presence of Defects, Strain, and Charged Impurities cond-mat.mtrl-sci · 2018 · author #14
  2. Electronic and structural characterization of divacancies in irradiated graphene cond-mat.mes-hall · 2011 · author #5

Mentions

  • 1112.5598 #5 · backfill · confidence 0.70 Jean-Yves Veuillen

Frequent Coauthors