Eduardo Abramof

Identifiers

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Papers (2)

1. X-ray tools for van der Waals epitaxy of bismuth telluride topological insulator films physics.app-ph · 2018 · author #6
2. Nanoscale characterization of bismuth telluride epitaxic layers by advanced X-ray analysis cond-mat.mtrl-sci · 2016 · author #4

Mentions

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Frequent Coauthors

• Celso I. Fornari 2 shared papers
• Paulo H. O. Rappl 2 shared papers
• Samuel Netzke 1 shared papers
• S\'ergio L. Morelh\~ao 1 shared papers
• Sergio L. Morelhao 1 shared papers
• Stefan Kycia 1 shared papers