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J. Moers

Identifiers

  • name variant J. Moers 0.60 · backfill

Papers (1)

  1. Strain determination in the Si channel above a single SiGe island inside a field effect transistor using nanobeam x-ray diffraction cond-mat.mes-hall · 2010 · author #10

Mentions

  • 1011.3978 #10 · backfill · confidence 0.70 J. Moers

Frequent Coauthors