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M. Mazzillo

Identifiers

  • name variant M. Mazzillo 0.60 · backfill

Papers (1)

  1. Electrical Characterization of SiPM as a Function of Test Frequency and Temperature physics.ins-det · 2011 · author #6

Mentions

  • 1112.0107 #6 · backfill · confidence 0.70 M. Mazzillo

Frequent Coauthors