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L. Creswell

Identifiers

  • name variant L. Creswell 0.60 · backfill

Papers (2)

  1. Cryogenic instrumentation for fast current measurement in a silicon single electron transistor cond-mat.mes-hall · 2009 · author #8
  2. Single shot measurement of a silicon single electron transistor cond-mat.str-el · 2008 · author #8

Mentions

  • 0904.3193 #8 · backfill · confidence 0.70 L. Creswell
  • 0811.0736 #8 · backfill · confidence 0.70 L. Creswell

Frequent Coauthors